X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 293.0
Details 20% (w/v) PEG 3350, 0.2M Lithium Nitrate, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.16 α = 90
b = 92.28 β = 90
c = 165.67 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV AXCO Capillary optic 2008-07-23
Diffraction Radiation
Monochromator Protocol
Ni Filter SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.54 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.26 50 95.2 0.062 -- -- 9.4 26633 25355 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.26 2.34 90.5 0.182 -- 13.1 9.2 2611

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.26 47.14 -- 0.0 25236 24020 1299 95.18 0.17561 0.17561 0.17233 0.23483 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.262 2.32 -- 81 1639 0.159 0.286 -- 90.29
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 25.671
Anisotropic B[1][1] -0.97
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.17
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.8
RMS Deviations
Key Refinement Restraint Deviation
r_chiral_restr 0.115
r_bond_refined_d 0.015
r_dihedral_angle_3_deg 17.746
r_dihedral_angle_1_deg 7.12
r_gen_planes_refined 0.007
r_dihedral_angle_4_deg 22.103
r_mcangle_it 1.509
r_angle_refined_deg 1.614
r_scangle_it 3.834
r_dihedral_angle_2_deg 33.831
r_scbond_it 2.419
r_mcbond_it 0.794
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3891
Nucleic Acid Atoms 0
Heterogen Atoms 44
Solvent Atoms 288

Software

Software
Software Name Purpose
CrystalClear data collection
PHASER phasing
REFMAC refinement version: 5.4.0067
HKL-2000 data reduction
HKL-2000 data scaling