X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 298.0
Details 0.15M ammonium citrate dibasic, 22%(w/v) PEG3350, pH8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.61 α = 90
b = 81.06 β = 90
c = 109.21 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD -- -- 2008-05-12
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.5798 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.18 50 88.9 -- -- -- -- 33389 29683 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.24 55.5 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.182 38.276 -- 1.33 33389 29562 1500 87.57 -- 0.2337 0.2317 0.2714 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1825 2.2529 -- 60 1229 0.25 0.2837 -- 47.0
X Ray Diffraction 2.2529 2.3334 -- 105 1794 0.2388 0.295 -- 64.0
X Ray Diffraction 2.3334 2.4268 -- 105 2130 0.2448 0.3408 -- 74.0
X Ray Diffraction 2.4268 2.5373 -- 135 2537 0.2504 0.3193 -- 88.0
X Ray Diffraction 2.5373 2.671 -- 150 2778 0.2427 0.2884 -- 97.0
X Ray Diffraction 2.671 2.8383 -- 165 2890 0.2446 0.3147 -- 100.0
X Ray Diffraction 2.8383 3.0574 -- 150 2885 0.2453 0.2808 -- 100.0
X Ray Diffraction 3.0574 3.3649 -- 150 2913 0.2375 0.304 -- 100.0
X Ray Diffraction 3.3649 3.8514 -- 159 2902 0.2402 0.2898 -- 99.0
X Ray Diffraction 3.8514 4.8508 -- 156 2918 0.2057 0.2154 -- 99.0
X Ray Diffraction 4.8508 38.2819 -- 165 3086 0.2154 0.2324 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.309
f_bond_d 0.01
f_chiral_restr 0.078
f_plane_restr 0.005
f_dihedral_angle_d 17.407
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4773
Nucleic Acid Atoms 0
Heterogen Atoms 60
Solvent Atoms 137

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building
PHENIX refinement
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing