X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 288.0
Details PEG 8000, NaCl, MgCl2, DTT, Bis-Tris, pH 6.5, HANGING DROP at 288K, pH 6.50, VAPOR DIFFUSION, HANGING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 151.44 α = 90
b = 161.64 β = 90
c = 202.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 KOHZU: Double Crystal Si(111) 2006-08-25
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.11587 ALS 8.3.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 75.05 81.1 -- -- -- 2.06 249249 249249 0.0 -- 10.6
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.05 -- 81.1 -- -- 13.0 2.06 308903

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.05 75.05 0.0 0.0 308903 249249 3564 80.7 0.194 0.194 0.193 0.231 1.5%, consistent with previous structures.
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.05 2.14 18896 278 18618 0.213 0.288 0.017 49.3
X Ray Diffraction 2.14 2.26 26295 368 25927 0.198 0.264 0.014 68.5
X Ray Diffraction 2.26 2.4 28207 418 27789 0.193 0.249 0.012 73.4
X Ray Diffraction 2.4 2.58 30171 461 29710 0.187 0.237 0.011 78.4
X Ray Diffraction 2.58 2.84 32565 453 32112 0.192 0.241 0.011 84.5
X Ray Diffraction 2.84 3.25 35607 508 35099 0.192 0.235 0.01 92.2
X Ray Diffraction 3.25 4.1 38443 544 37899 0.183 0.214 0.009 99.0
X Ray Diffraction 4.1 75.05 39065 534 38531 0.199 0.211 0.009 98.6
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Isotropic
Mean Isotropic B 18.43
Anisotropic B[1][1] -0.52
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.6
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.08
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.005
x_angle_deg 1.4
x_torsion_deg 25.7
x_torsion_impr_deg 0.91
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Luzzati Sigma A (Observed) 0.11
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.26
Luzzati Sigma A (R-Free Set) 0.2
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 32496
Nucleic Acid Atoms 0
Heterogen Atoms 449
Solvent Atoms 2607

Software

Software
Software Name Purpose
CNS refinement version: 1.2
ADSC data collection version: Quantum
MOSFLM data reduction
SCALA data scaling
CNS phasing