X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 1.5 M sodium citrate, 50 mM HEPES, 10 mM DTT, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 74.69 α = 90
b = 74.69 β = 90
c = 74.88 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 BENT CONICAL Si MIRROR 2006-03-11
Diffraction Radiation
Monochromator Protocol
BENT Ge(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-C 0.9 APS 14-BM-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.15 25 100.0 0.068 -- -- 10.9 85989 85989 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.15 1.19 100.0 0.365 -- 6.0 8.0 8467

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.15 25.0 0.0 0.0 85858 85858 4304 100.0 0.1154 0.1154 0.1148 0.1403 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.15 1.19 8246 -- -- 0.153 -- -- --
RMS Deviations
Key Refinement Restraint Deviation
s_angle_d 0.031
s_bond_d 0.015
s_zero_chiral_vol 0.083
s_rigid_bond_adp_cmpnt 0.005
s_approx_iso_adps 0.117
s_from_restr_planes 0.0303
s_non_zero_chiral_vol 0.096
s_anti_bump_dis_restr 0.035
s_similar_adp_cmpnt 0.052
s_similar_dist 0.0
Coordinate Error
Parameter Value
Number Disordered Residues 13.0
Occupancy Sum Hydrogen 1412.0
Occupancy Sum Non Hydrogen 1631.7
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1484
Nucleic Acid Atoms 0
Heterogen Atoms 22
Solvent Atoms 245

Software

Software
Software Name Purpose
SHELX model building
SHELXL-97 refinement
ADSC data collection version: Quantum
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing