X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.6
Temperature 298.0
Details 0.4M Citrate pH 5.6 15-20% PEG 4000 10% Isopropanol, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 53.54 α = 90
b = 70.22 β = 90
c = 144.29 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2007-03-26
Diffraction Radiation
Monochromator Protocol
SSRL beamline 11-1 MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 1.12710, 0.97931, 0.97899, 0.91837 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 42.58 99.0 -- -- -- -- 37481 37102 0.0 0.0 24.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.07 97.1 0.41 0.41 2.3 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.0 42.58 0.0 0.0 37481 35040 3498 93.5 0.227 0.227 0.222 0.26 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.09 3765 401 3364 0.305 0.347 0.017 81.9
X Ray Diffraction 2.09 2.2 4104 399 3705 0.264 0.312 0.016 88.5
X Ray Diffraction 2.2 2.34 4252 423 3829 0.243 0.284 0.014 91.8
X Ray Diffraction 2.34 2.52 4357 447 3910 0.244 0.28 0.013 94.0
X Ray Diffraction 2.52 2.78 4487 477 4010 0.235 0.294 0.013 96.1
X Ray Diffraction 2.78 3.18 4541 447 4094 0.229 0.287 0.014 97.2
X Ray Diffraction 3.18 4.0 4676 446 4230 0.199 0.211 0.01 98.8
X Ray Diffraction 4.0 42.58 4858 458 4400 0.21 0.248 0.012 98.4
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 42.92
Anisotropic B[1][1] 2.35
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -2.2
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.15
RMS Deviations
Key Refinement Restraint Deviation
x_torsion_impr_deg 0.78
x_bond_d 0.008
x_angle_deg 1.3
x_torsion_deg 22.2
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.25
Luzzati Sigma A (Observed) 0.24
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.3
Luzzati Sigma A (R-Free Set) 0.3
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4505
Nucleic Acid Atoms 0
Heterogen Atoms 55
Solvent Atoms 259

Software

Software
Software Name Purpose
CNS refinement version: 1.2
HKL-2000 data collection
HKL-2000 data reduction
HKL-2000 data scaling
SOLVE phasing