ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State FILAMENT
Sample Reconstruction Method HELICAL
Name of Sample Wild-type SafA pili
EM Data Acquisition
Date of Experiment 2004-04-23
Temperature (Kelvin) --
Microscope Model FEI TECNAI 10
Detector Type KODAK SO-163 FILM
Minimum Defocus (nm) 400.0
Maximum Defocus (nm) 900.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 2.4
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 25.0
Illumination Mode FLOOD BEAM
Nominal Magnification 44000
Calibrated Magnification --
Source TUNGSTEN HAIRPIN
Acceleration Voltage (kV) 100
Imaging Details --
3D Reconstruction
Software Package(s) IMAGIC
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles 5000
Other Details --
Effective Resolution 17.0
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
RECIPROCAL RIGID BODY FIT Correlation coefficient -- -- --