X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 294.0
Details 100mM Bis-Tris pH 6.5, 25% PEG 3350, 200mM Sodium chloride, 10% Glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 294K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 69.45 α = 90
b = 69.45 β = 90
c = 49.14 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2007-03-01
Diffraction Radiation
Monochromator Protocol
DIAMOND SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.9793 APS 31-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.61 20.63 99.2 0.104 -- -- 17.4 -- 17659 -- -5.0 20.433
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.61 1.69 96.3 0.95 -- 3.0 15.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.61 20.0 -- -- -- 16936 555 99.19 -- 0.20213 0.20136 0.22596 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.61 1.65 -- 25 1153 0.32 0.472 -- 91.25
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 23.159
Anisotropic B[1][1] 0.67
Anisotropic B[1][2] 0.34
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.67
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.01
RMS Deviations
Key Refinement Restraint Deviation
r_scbond_it 5.49
r_dihedral_angle_3_deg 13.347
r_angle_refined_deg 1.312
r_dihedral_angle_1_deg 5.199
r_dihedral_angle_4_deg 11.065
r_bond_refined_d 0.01
r_mcangle_it 4.095
r_dihedral_angle_2_deg 37.263
r_mcbond_it 3.311
r_nbtor_refined 0.304
r_symmetry_vdw_refined 0.117
r_nbd_refined 0.171
r_xyhbond_nbd_refined 0.168
r_gen_planes_refined 0.005
r_symmetry_hbond_refined 0.192
r_chiral_restr 0.095
r_scangle_it 7.057
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 969
Nucleic Acid Atoms 0
Heterogen Atoms 13
Solvent Atoms 106

Software

Software
Software Name Purpose
SHELX model building
REFMAC refinement version: 5.3.0034
MAR345 data collection version: CCD
MOSFLM data reduction
SCALA data scaling
SHELXCD phasing
SHELXE model building