X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 295.0
Details 0.1M HEPES, 0.25M Sodium chloride, 25% (w/v) PEG 4000, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 83.43 α = 99.69
b = 94.84 β = 97.9
c = 94.59 γ = 116.13
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD Mirrors 2006-06-16
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 5ID-B 1.0000 APS 5ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 30 97.4 0.062 -- -- 3.5 224520 224520 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.86 94.2 0.394 -- 3.0 3.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIRAS 1.8 25.0 -- -- -- 213579 11269 97.36 -- 0.16873 0.16667 0.20754 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.847 -- 801 15149 0.247 0.299 -- 93.47
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.265
Anisotropic B[1][1] 1.43
Anisotropic B[1][2] -0.2
Anisotropic B[1][3] 1.49
Anisotropic B[2][2] -1.26
Anisotropic B[2][3] 0.15
Anisotropic B[3][3] 0.12
RMS Deviations
Key Refinement Restraint Deviation
r_chiral_restr 0.129
r_dihedral_angle_1_deg 4.167
r_symmetry_hbond_refined 0.166
r_nbd_refined 0.206
r_xyhbond_nbd_refined 0.141
r_symmetry_vdw_refined 0.258
r_gen_planes_refined 0.007
r_mcangle_it 1.81
r_dihedral_angle_3_deg 10.547
r_dihedral_angle_2_deg 37.716
r_bond_refined_d 0.015
r_mcbond_it 1.286
r_scangle_it 3.859
r_dihedral_angle_4_deg 13.506
r_angle_refined_deg 1.66
r_scbond_it 2.736
r_nbtor_refined 0.308
r_metal_ion_refined 0.111
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 17064
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 2455

Software

Software
Software Name Purpose
REFMAC refinement version: 5.2.0019
MAR345 data collection version: CCD
HKL-2000 data reduction
HKL-2000 data scaling
SHARP phasing