X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 11 % (v/v) Ethylene glycol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 59.17 α = 90
b = 138.73 β = 90
c = 141.66 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate Osmic Mirrors 2007-09-30
Diffraction Radiation
Monochromator Protocol
Osmic SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE OTHER 1.54179 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 30 97.3 -- 0.045 -- 4.7 68502 68502 0.0 0.0 20.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.65 1.74 95.3 -- 0.539 2.1 4.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS 1.65 20.0 -- 0.0 65002 65002 3469 97.32 -- 0.16943 0.16783 0.19924 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.65 1.693 -- 229 4662 0.389 0.401 -- 94.97
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 19.378
Anisotropic B[1][1] -0.24
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.59
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.35
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_2_deg 35.823
r_nbd_refined 0.213
r_dihedral_angle_3_deg 12.872
r_chiral_restr 0.087
r_symmetry_hbond_refined 0.17
r_bond_refined_d 0.013
r_dihedral_angle_1_deg 5.473
r_mcangle_it 1.119
r_symmetry_vdw_refined 0.214
r_dihedral_angle_4_deg 18.417
r_angle_refined_deg 1.351
r_gen_planes_refined 0.006
r_xyhbond_nbd_refined 0.154
r_scangle_it 3.166
r_scbond_it 2.023
r_mcbond_it 0.738
r_nbtor_refined 0.301
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.087
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3417
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 723

Software

Software
Software Name Purpose
REFMAC refinement version: 5.2.0019
MAR345dtb data collection
DENZO data reduction
SCALEPACK data scaling
SHELXCD phasing
SHELXE model building