X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 0.1M MES, 0.1M ammonium sulfate, 15% PEG5000, pH6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.58 α = 90
b = 67.83 β = 90
c = 113.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2008-10-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL41XU 1.00 SPring-8 BL41XU

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 -- -- -- -- -- -- 19841 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.005 43.446 -- 1.52 -- 19791 1030 48.89 -- 0.213 0.2103 0.255 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0048 2.1105 -- 106 2061 0.2503 0.3072 -- 37.0
X Ray Diffraction 2.1105 2.2427 -- 125 2499 0.2306 0.3171 -- 45.0
X Ray Diffraction 2.2427 2.4159 -- 150 2689 0.2255 0.2839 -- 49.0
X Ray Diffraction 2.4159 2.659 -- 160 2795 0.2024 0.2487 -- 51.0
X Ray Diffraction 2.659 3.0437 -- 163 2858 0.211 0.2487 -- 52.0
X Ray Diffraction 3.0437 3.8343 -- 159 2936 0.1974 0.2443 -- 54.0
X Ray Diffraction 3.8343 43.4558 -- 167 2923 0.2054 0.2433 -- 53.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 18.566
f_plane_restr 0.003
f_chiral_restr 0.079
f_angle_d 0.992
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1820
Nucleic Acid Atoms 0
Heterogen Atoms 27
Solvent Atoms 79

Software

Software
Software Name Purpose
PHENIX refinement
HKL-2000 data collection
HKL-2000 data reduction
HKL-2000 data scaling
MOLREP phasing