X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 293.0
Details Trimethylamine n-oxide, Polyethylene glycol MME 2000, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 36.9 α = 87.03
b = 45.06 β = 78.96
c = 84.15 γ = 83.49
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 monochromator 2006-12-11
Diffraction Radiation
Monochromator Protocol
Si-111 MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL44B2 0.9791, 0.9794, 1.0000 SPring-8 BL44B2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 97.3 0.022 -- -- 2.0 48889 47547 0.0 0.0 19.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.86 96.0 0.098 -- 6.8 2.0 4704

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.8 29.63 -- 0.0 48975 47380 4775 96.7 0.235 0.202 0.202 0.235 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.86 4015 452 -- 0.211 0.261 -- --
X Ray Diffraction 1.86 1.94 4301 439 -- 0.197 0.268 -- --
X Ray Diffraction 1.94 2.03 4230 479 -- 0.194 0.245 -- --
X Ray Diffraction 2.03 2.13 4249 496 -- 0.193 0.244 -- --
X Ray Diffraction 2.13 2.27 4297 470 -- 0.194 0.236 -- --
X Ray Diffraction 2.27 2.44 4274 494 -- 0.194 0.242 -- --
X Ray Diffraction 2.44 2.69 4252 518 -- 0.204 0.255 -- --
X Ray Diffraction 2.69 3.08 4371 464 -- 0.219 0.256 -- --
X Ray Diffraction 3.08 3.88 4355 467 -- 0.211 0.233 -- --
X Ray Diffraction 3.88 50.0 4261 496 -- 0.192 0.197 -- --
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 1.21
c_angle_d 1.61
c_bond_d 0.0138
c_dihedral_angle_d 22.8
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.21
Luzzati Sigma A (Observed) -0.01
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.25
Luzzati Sigma A (R-Free Set) 0.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4168
Nucleic Acid Atoms 0
Heterogen Atoms 54
Solvent Atoms 256

Software

Software
Software Name Purpose
HKL-2000 data collection
Rantan model building
CNS refinement version: 1.1
HKL-2000 data reduction
SCALEPACK data scaling
Rantan phasing