X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7
Details 12% PEG3350, 0.2 M KSCN, pH 7

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.65 α = 90
b = 70.76 β = 90
c = 134.04 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARRESEARCH MIRRORS 2009-02-13
Diffraction Radiation
Monochromator Protocol
SI(111) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9788, 0.9788, 0.97922 SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 67 99.3 -- 0.1 -- 4.0 -- 32014 -- 0.0 26.11
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.15 99.6 -- 0.66 2.2 4.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.1 67.02 -- 2.01 -- 32009 1600 99.35 -- 0.2003 0.1986 0.2323 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.1751 -- 155 2982 0.2477 0.2666 -- 100.0
X Ray Diffraction 2.1751 2.2622 -- 138 3050 0.2207 0.272 -- 100.0
X Ray Diffraction 2.2622 2.3652 -- 189 2973 0.2143 0.2441 -- 100.0
X Ray Diffraction 2.3652 2.4899 -- 178 3002 0.2121 0.2662 -- 100.0
X Ray Diffraction 2.4899 2.6459 -- 126 3051 0.2153 0.2919 -- 100.0
X Ray Diffraction 2.6459 2.8502 -- 176 3034 0.2096 0.2556 -- 100.0
X Ray Diffraction 2.8502 3.137 -- 145 3045 0.1967 0.2025 -- 100.0
X Ray Diffraction 3.137 3.5909 -- 159 3039 0.1879 0.2335 -- 99.0
X Ray Diffraction 3.5909 4.524 -- 170 3069 0.169 0.227 -- 99.0
X Ray Diffraction 4.524 67.0541 -- 164 3164 0.1943 0.1856 -- 97.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 33.6
Anisotropic B[1][1] -0.6423
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 7.2835
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -6.6413
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.008
f_plane_restr 0.005
f_dihedral_angle_d 16.439
f_chiral_restr 0.061
f_angle_d 0.93
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3812
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 519

Software

Software
Software Name Purpose
XDS data reduction
XSCALE data scaling
SHELX phasing version: C/D
autoSHARP phasing
PHENIX refinement