X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 84.77 α = 90
b = 84.77 β = 90
c = 137.9 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-3 -- ESRF ID14-3

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 20 93.3 0.09 -- -- 14.1 -- 24483 -- 4.8 38.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.23 2.4 89.3 0.78 -- 3.5 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 29.287 -- 1.99 -- 24457 1225 93.24 -- 0.2177 0.2162 0.2442 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2001 2.2882 -- 132 2496 0.6177 0.6123 -- 92.0
X Ray Diffraction 2.2882 2.3923 -- 70 1330 0.2809 0.2609 -- 49.0
X Ray Diffraction 2.3923 2.5183 -- 143 2709 0.2345 0.2992 -- 100.0
X Ray Diffraction 2.5183 2.676 -- 143 2717 0.2162 0.2659 -- 100.0
X Ray Diffraction 2.676 2.8825 -- 144 2737 0.2014 0.226 -- 100.0
X Ray Diffraction 2.8825 3.1722 -- 145 2756 0.2133 0.2692 -- 100.0
X Ray Diffraction 3.1722 3.6305 -- 145 2746 0.2045 0.2754 -- 99.0
X Ray Diffraction 3.6305 4.5713 -- 147 2790 0.1583 0.1922 -- 99.0
X Ray Diffraction 4.5713 29.2896 -- 156 2951 0.1603 0.1712 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 7.3496
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 7.3496
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -14.6991
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 20.319
f_bond_d 0.007
f_angle_d 1.215
f_chiral_restr 0.074
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2620
Nucleic Acid Atoms 0
Heterogen Atoms 56
Solvent Atoms 135

Software

Software
Software Name Purpose
PHENIX refinement version: (PHENIX.REFINE)
XDS data reduction
XSCALE data scaling
PHASER phasing