ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State FILAMENT
Sample Reconstruction Method HELICAL
Name of Sample RecA filament
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model JEOL 1200EXII
Detector Type --
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS --
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) --
Illumination Mode FLOOD BEAM
Nominal Magnification --
Calibrated Magnification --
Source --
Acceleration Voltage (kV) 80
Imaging Details --
3D Reconstruction
Software Package(s) --
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles --
Other Details --
Effective Resolution --