ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State PARTICLE
Sample Reconstruction Method SINGLE PARTICLE
Name of Sample SR-SRP-RNC COMPLEX
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model FEI TECNAI F30
Detector Type KODAK SO-163 FILM
Minimum Defocus (nm) 800.0
Maximum Defocus (nm) 3500.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS --
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) --
Illumination Mode FLOOD BEAM
Nominal Magnification --
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s) --
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles --
Other Details --
Effective Resolution 7.4