X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop Nanodrop
Temperature 277.0
Details 20.0% PEG-3350, 0.2M NaFormate, 2.0mM n-Dodecyl-beta-D-maltoside, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 165.12 α = 90
b = 165.12 β = 90
c = 68.7 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- 2004-08-04
Diffraction Radiation
Monochromator Protocol
Double Crystal Si(111) SINGLE WAVELENGTH
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 1.0000,0.9796 ALS 8.2.1
SYNCHROTRON ALS BEAMLINE 8.2.1 -- ALS 8.2.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.82 28.41 98.2 -- 0.054 -- 4.8 -- 94227 -- -- 36.02
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.82 1.92 89.3 -- 0.418 2.2 2.5 12449

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.82 28.41 -- -- -- 89425 4716 98.08 -- 0.18022 0.17902 0.20341 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.82 1.866 -- 286 5671 0.3 0.306 -- 84.04
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 40.428
Anisotropic B[1][1] 0.32
Anisotropic B[1][2] 0.16
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.32
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.48
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_4_deg 22.09
r_symmetry_vdw_other 0.231
r_xyhbond_nbd_other 0.242
r_scangle_it 7.386
r_symmetry_vdw_refined 0.135
r_angle_refined_deg 1.553
r_dihedral_angle_3_deg 12.992
r_xyhbond_nbd_refined 0.183
r_nbtor_refined 0.187
r_gen_planes_refined 0.006
r_bond_other_d 0.002
r_nbd_refined 0.224
r_mcbond_it 2.226
r_angle_other_deg 0.877
r_mcbond_other 0.617
r_nbd_other 0.193
r_chiral_restr 0.092
r_dihedral_angle_1_deg 6.565
r_nbtor_other 0.089
r_scbond_it 5.417
r_bond_refined_d 0.017
r_mcangle_it 2.801
r_gen_planes_other 0.001
r_dihedral_angle_2_deg 34.714
r_symmetry_hbond_refined 0.16
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6535
Nucleic Acid Atoms 0
Heterogen Atoms 148
Solvent Atoms 353

Software

Software
Software Name Purpose
XDSauto data collection
SCALA data scaling version: 4.2)
SHELX model building
SHARP phasing
REFMAC refinement version: 5.2.0005
XDS data reduction
CCP4 data scaling version: (SCALA)
SHELX phasing