X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop Nanodrop
Temperature 293.0
Details 0.4M (NH4)2Tartrate, 0.4% PEG-3350, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 181.14 α = 90
b = 45.26 β = 93.3
c = 77.26 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- 2004-02-11
Diffraction Radiation
Monochromator Protocol
Single crystal, cylindrically bent, Si(220) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.3 -- ALS 5.0.3

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 60.4 92.3 -- 0.07 -- 3.2 -- 39375 -- -- 37.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.05 61.2 -- 0.682 1.3 1.9 1884

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.15 60.4 -- -- -- 32122 1676 97.96 -- 0.19189 0.18954 0.23539 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.15 2.206 -- 102 2001 0.238 0.29 -- 83.72
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 31.282
Anisotropic B[1][1] 1.99
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.85
Anisotropic B[2][2] -1.2
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.68
RMS Deviations
Key Refinement Restraint Deviation
r_mcbond_other 0.16
r_chiral_restr 0.081
r_symmetry_vdw_refined 0.16
r_gen_planes_refined 0.006
r_bond_refined_d 0.015
r_dihedral_angle_4_deg 21.355
r_angle_other_deg 0.862
r_mcangle_it 0.839
r_nbd_other 0.177
r_dihedral_angle_1_deg 6.023
r_xyhbond_nbd_refined 0.178
r_symmetry_hbond_refined 0.254
r_symmetry_vdw_other 0.186
r_scbond_it 1.559
r_nbtor_other 0.087
r_gen_planes_other 0.003
r_nbd_refined 0.202
r_angle_refined_deg 1.477
r_dihedral_angle_3_deg 14.158
r_mcbond_it 0.55
r_bond_other_d 0.003
r_dihedral_angle_2_deg 37.216
r_scangle_it 2.376
r_nbtor_refined 0.181
r_xyhbond_nbd_other 0.059
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4537
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 279

Software

Software
Software Name Purpose
MOSFLM data reduction
SCALA data scaling version: 4.2)
MOLREP phasing
REFMAC refinement version: 5.2.0005
CCP4 data scaling version: (SCALA)