X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop Nanodrop
pH 6.1
Temperature 293.0
Details 0.2% MPD, 0.2M NH4OAc, 0.1M Na,K-Phosphate pH 6.1, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 210.34 α = 90
b = 210.34 β = 90
c = 210.34 γ = 90
Symmetry
Space Group F 4 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC -- 2003-09-20
Diffraction Radiation
Monochromator Protocol
Double Crystal Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 -- ALS 8.2.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 63.32 99.8 -- 0.071 -- 6.9 -- 19349 -- -- 58.84
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.31 98.1 -- 0.734 5014.0 4.2 1366

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.25 63.32 -- -- -- 18186 986 98.83 -- 0.19049 0.18917 0.21528 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.25 2.313 -- 65 1276 0.293 0.362 -- 96.41
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 47.765
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_4_deg 24.321
r_angle_other_deg 0.882
r_scangle_it 2.735
r_bond_other_d 0.001
r_dihedral_angle_2_deg 35.407
r_nbd_other 0.182
r_bond_refined_d 0.015
r_nbtor_refined 0.177
r_dihedral_angle_3_deg 14.655
r_angle_refined_deg 1.576
r_gen_planes_refined 0.005
r_symmetry_vdw_refined 0.192
r_mcbond_it 0.731
r_nbd_refined 0.214
r_gen_planes_other 0.001
r_symmetry_vdw_other 0.286
r_symmetry_hbond_refined 0.232
r_chiral_restr 0.086
r_xyhbond_nbd_refined 0.151
r_mcbond_other 0.154
r_nbtor_other 0.087
r_mcangle_it 1.149
r_dihedral_angle_1_deg 7.118
r_scbond_it 1.823
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2404
Nucleic Acid Atoms 0
Heterogen Atoms 15
Solvent Atoms 94

Software

Software
Software Name Purpose
MOSFLM data reduction
SCALA data scaling version: 4.2)
MOLREP phasing
REFMAC refinement version: 5.2.0005
CCP4 data scaling version: (SCALA)