X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop Nanodrop
pH 7.7
Temperature 277.0
Details 0.2M MgAcetate, 20% PEG-3350, pH 7.7, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 45.42 α = 90
b = 45.42 β = 90
c = 74.34 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2004-05-02
Diffraction Radiation
Monochromator Protocol
double crystal monochromator MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.898407, 0.979608, 0.979462 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 27.02 96.8 -- 0.086 -- 5.1 -- 6172 -- -- 33.51
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.11 83.9 -- 0.416 2.6 3.0 756

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.0 27.02 -- -- -- 5871 278 96.58 -- 0.19954 0.19696 0.25276 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.108 -- 32 717 0.279 0.292 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 32.457
Anisotropic B[1][1] 1.54
Anisotropic B[1][2] 0.77
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.54
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.31
RMS Deviations
Key Refinement Restraint Deviation
r_bond_refined_d 0.014
r_dihedral_angle_3_deg 16.569
r_scangle_it 8.631
r_symmetry_hbond_refined 0.118
r_angle_refined_deg 1.373
r_nbd_refined 0.206
r_dihedral_angle_2_deg 33.814
r_chiral_restr 0.092
r_mcbond_it 1.929
r_scbond_it 5.825
r_gen_planes_refined 0.005
r_xyhbond_nbd_refined 0.15
r_mcangle_it 3.03
r_symmetry_vdw_refined 0.18
r_dihedral_angle_1_deg 5.297
r_dihedral_angle_4_deg 10.859
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 683
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 45

Software

Software
Software Name Purpose
MOSFLM data reduction
SCALA data scaling version: 4.2)
autoSHARP phasing
SOLOMON phasing
REFMAC refinement version: 5.2.0001
CCP4 data scaling version: (SCALA)