X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.8 α = 90
b = 150.4 β = 90
c = 79.5 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 1.15 NSLS X8C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 49.82 -- -- -- -- -- 46129 n/a 0.0 -- 19.3

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.55 49.82 -- -- 46357 45654 4602 98.5 -- -- 0.242 0.258 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.55 1.61 4353 425 3928 0.279 0.322 0.016 94.8
X Ray Diffraction 1.61 1.67 4501 485 4016 0.266 0.291 0.013 98.2
X Ray Diffraction 1.67 1.75 4525 435 4090 0.268 0.31 0.015 98.5
X Ray Diffraction 1.75 1.84 4545 460 4085 0.252 0.263 0.012 98.7
X Ray Diffraction 1.84 1.95 4553 446 4107 0.25 0.28 0.013 98.4
X Ray Diffraction 1.95 2.1 4554 492 4062 0.246 0.267 0.012 99.0
X Ray Diffraction 2.1 2.32 4597 473 4124 0.248 0.259 0.012 99.2
X Ray Diffraction 2.32 2.65 4654 443 4211 0.241 0.238 0.011 99.7
X Ray Diffraction 2.65 3.34 4646 475 4171 0.239 0.245 0.011 99.5
X Ray Diffraction 3.34 49.82 4726 468 4258 0.229 0.247 0.011 97.1
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 20.63
Anisotropic B[1][1] -1.28
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.66
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.62
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.005
c_torsion_impr_deg 0.83
c_torsion_deg 23.8
c_angle_deg 1.3
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.21
Luzzati Sigma A (Observed) 0.13
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.22
Luzzati Sigma A (R-Free Set) 0.17
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2149
Nucleic Acid Atoms 0
Heterogen Atoms 57
Solvent Atoms 197

Software

Software
Software Name Purpose
CNS refinement version: 1.1
HKL-2000 data reduction
SCALEPACK data scaling
CNS phasing version: 1.1