X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.6 α = 90
b = 149.4 β = 90
c = 79.7 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 1.15 NSLS X8C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 49.61 -- -- -- -- -- 31989 n/a 0.0 -- 23.7

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.75 49.61 -- -- 32120 31620 3157 98.4 -- -- 0.214 0.227 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.81 3045 305 2740 0.233 0.264 0.015 95.6
X Ray Diffraction 1.81 1.89 3067 286 2781 0.211 0.234 0.014 96.8
X Ray Diffraction 1.89 1.97 3135 310 2825 0.203 0.25 0.014 98.4
X Ray Diffraction 1.97 2.07 3147 319 2828 0.204 0.216 0.012 98.8
X Ray Diffraction 2.07 2.2 3166 356 2810 0.204 0.222 0.012 99.3
X Ray Diffraction 2.2 2.38 3151 316 2835 0.201 0.232 0.013 99.1
X Ray Diffraction 2.38 2.61 3193 321 2872 0.21 0.212 0.012 99.3
X Ray Diffraction 2.61 2.99 3211 320 2891 0.21 0.221 0.012 99.6
X Ray Diffraction 2.99 3.77 3239 304 2935 0.208 0.223 0.013 99.2
X Ray Diffraction 3.77 49.61 3266 320 2946 0.229 0.231 0.013 96.6
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.36
Anisotropic B[1][1] -1.35
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.11
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.24
RMS Deviations
Key Refinement Restraint Deviation
c_bond_d 0.005
c_torsion_deg 23.8
c_torsion_impr_deg 0.82
c_angle_deg 1.3
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.19
Luzzati Sigma A (Observed) 0.07
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.21
Luzzati Sigma A (R-Free Set) 0.12
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2174
Nucleic Acid Atoms 0
Heterogen Atoms 57
Solvent Atoms 124

Software

Software
Software Name Purpose
CNS refinement version: 1.1
HKL-2000 data reduction
SCALEPACK data scaling
CNS phasing version: 1.1