X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 9
Temperature 289.0
Details 1.3-1.4 M ammonium sulfate, 8 % glycerol, 100 mM glycine-NaOH pH 9.0, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 116.5 α = 90
b = 116.5 β = 90
c = 69.8 γ = 90
Symmetry
Space Group I 41

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD BRANDEIS -- --
IMAGE PLATE RIGAKU RAXIS IV -- --
Diffraction Radiation
Monochromator Protocol
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.98 NSLS X12C
SYNCHROTRON NSLS BEAMLINE X12C 0.95189, 0.950051 NSLS X12C
ROTATING ANODE RIGAKU RU200 1.54 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 20 96.8 0.051 -- -- 3.5 41963 146987 -- 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.83 93.2 0.206 -- 3.74 -- 1976

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR 1.8 20.0 -- 0.0 37121 -- 1883 -- -- -- 0.21 0.25 5% of total reflection (Random)
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 20.0 37121 1883 -- 0.21 0.25 -- 86.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 0.943
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.4
x_bond_d 0.01
x_dihedral_angle_d 23.4
x_angle_d 1.5
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2474
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 256

Software

Software
Software Name Purpose
PHASES phasing
X-PLOR refinement version: 3.851
DENZO data reduction
SCALEPACK data scaling