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X-RAY DIFFRACTION
Materials and Methods page
6MHT
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.6
    Temperature 293.0
    Details 1.4-1.8 M AMMONIUM SULFATE 50 MM CITRATE PH 5.6, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 99.86 α = 90
    b = 99.86 β = 90
    c = 325.2 γ = 120
     
    Space Group
    Space Group Name:    H 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 293
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X12C
    Wavelength 1.1500
    Site NSLS
    Beamline X12C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.05
    Resolution(Low) 20
    Number Reflections(Observed) 32880
    Percent Possible(Observed) 98.0
    R Merge I(Observed) 0.078
    Redundancy 3.33
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.05
    Resolution(Low) 5.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 30012
    Number of Reflections(R-Free) 2998
    Percent Reflections(Observed) 81.6
    R-Work 0.186
    R-Free 0.231
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.6
    x_bond_d 0.01
    x_angle_deg 1.8
    x_dihedral_angle_d 25.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2606
    Nucleic Acid Atoms 494
    Heterogen Atoms 27
    Solvent Atoms 148
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1