ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State FILAMENT
Sample Reconstruction Method HELICAL
Name of Sample eNP nucleocapsid-like assembly
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model JEOL 3200FSC
Detector Type GATAN K2 SUMMIT (4k x 4k)
Minimum Defocus (nm) --
Maximum Defocus (nm) --
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 4.7
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 24.0
Illumination Mode FLOOD BEAM
Nominal Magnification 30000
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s) RELION
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles 169526
Other Details --
Effective Resolution 5.8
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL FLEXIBLE FIT Correlation coefficient 276.0 -- --