ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details 5 second blotting time with force 3
Sample Aggregation State FILAMENT
Sample Reconstruction Method HELICAL
Name of Sample BCL10 CARD
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model FEI TECNAI ARCTICA
Detector Type DIRECT ELECTRON DE-16 (4k x 4k)
Minimum Defocus (nm) 1000.0
Maximum Defocus (nm) 6000.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 40.0
Illumination Mode FLOOD BEAM
Nominal Magnification --
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details --
3D Reconstruction
Software Package(s) PHENIX
Reconstruction Method(s) phenix refine
EM Image Reconstruction Statistics
Number of Particles 39992
Other Details --
Effective Resolution 4.0
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
-- RIGID BODY FIT -- -- -- --