X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 294.0
Details 22.5 % w/v PEG4000, 15 % v/v glycerol, 153 mM ammonium acetate and 85 mM sodium citrate pH 5.6

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 143.32 α = 90
b = 143.32 β = 90
c = 172.7 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS3 6M -- 2016-07-13
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.991 ESRF ID29

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.25 47.66 100.0 0.168 -- -- 11.1 -- 32784 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.25 3.36 100.0 -- -- 1.8 11.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.25 46.911 -- 1.34 -- 32783 1587 99.78 -- 0.254 0.2523 0.2856 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.25 3.3008 -- 110 2686 0.364 0.3671 -- 100.0
X Ray Diffraction 3.3008 3.3549 -- 117 2745 0.3516 0.4231 -- 100.0
X Ray Diffraction 3.3549 3.4128 -- 108 2737 0.3643 0.3791 -- 100.0
X Ray Diffraction 3.4128 3.4748 -- 164 2618 0.3384 0.3915 -- 100.0
X Ray Diffraction 3.4748 3.5416 -- 202 2621 0.3294 0.3544 -- 100.0
X Ray Diffraction 3.5416 3.6139 -- 158 2698 0.3055 0.4112 -- 100.0
X Ray Diffraction 3.6139 3.6924 -- 122 2712 0.3056 0.3467 -- 100.0
X Ray Diffraction 3.6924 3.7783 -- 170 2655 0.2892 0.3584 -- 100.0
X Ray Diffraction 3.7783 3.8727 -- 144 2692 0.2873 0.3809 -- 99.0
X Ray Diffraction 3.8727 3.9774 -- 140 2699 0.2885 0.2773 -- 100.0
X Ray Diffraction 3.9774 4.0943 -- 122 2685 0.25 0.3123 -- 100.0
X Ray Diffraction 4.0943 4.2264 -- 113 2724 0.2425 0.2645 -- 100.0
X Ray Diffraction 4.2264 4.3774 -- 140 2697 0.232 0.2454 -- 100.0
X Ray Diffraction 4.3774 4.5525 -- 156 2666 0.2208 0.281 -- 100.0
X Ray Diffraction 4.5525 4.7595 -- 144 2692 0.2211 0.2417 -- 100.0
X Ray Diffraction 4.7595 5.0102 -- 114 2707 0.2267 0.2867 -- 100.0
X Ray Diffraction 5.0102 5.3237 -- 118 2751 0.2302 0.2371 -- 100.0
X Ray Diffraction 5.3237 5.734 -- 166 2673 0.249 0.3059 -- 100.0
X Ray Diffraction 5.734 6.3098 -- 102 2726 0.2625 0.2642 -- 100.0
X Ray Diffraction 6.3098 7.22 -- 100 2749 0.244 0.364 -- 100.0
X Ray Diffraction 7.22 9.0857 -- 160 2663 0.2312 0.2365 -- 100.0
X Ray Diffraction 9.0857 46.916 -- 155 2690 0.2142 0.2247 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.827
f_dihedral_angle_d 16.91
f_bond_d 0.003
f_chiral_restr 0.033
f_plane_restr 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11250
Nucleic Acid Atoms 1881
Heterogen Atoms 0
Solvent Atoms 0

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
XDS data reduction
Aimless data scaling
PHASER phasing