X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.15
Details 100 mM MES pH 5.6-6.2 20-30 % PEG4000 50 mM BOG

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.12 α = 90
b = 75.18 β = 90
c = 78.35 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 90
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M-F -- 2015-03-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9786 SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 100.0 -- -- -- 13.1 -- 31410 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 2.0 100.0 -- -- 3.86 12.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.9 41.938 -- 1.37 -- 31410 1571 99.95 -- 0.1911 0.1895 0.222 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9002 1.9616 -- 139 2644 0.2908 0.3212 -- 99.0
X Ray Diffraction 1.9616 2.0317 -- 140 2663 0.2476 0.3256 -- 100.0
X Ray Diffraction 2.0317 2.113 -- 142 2685 0.2107 0.2618 -- 100.0
X Ray Diffraction 2.113 2.2092 -- 140 2674 0.1997 0.2525 -- 100.0
X Ray Diffraction 2.2092 2.3256 -- 142 2687 0.198 0.2321 -- 100.0
X Ray Diffraction 2.3256 2.4713 -- 141 2685 0.1916 0.2033 -- 100.0
X Ray Diffraction 2.4713 2.6621 -- 143 2708 0.2023 0.2363 -- 100.0
X Ray Diffraction 2.6621 2.9299 -- 143 2723 0.2066 0.2491 -- 100.0
X Ray Diffraction 2.9299 3.3538 -- 143 2724 0.2065 0.2347 -- 100.0
X Ray Diffraction 3.3538 4.2248 -- 146 2759 0.1703 0.1979 -- 100.0
X Ray Diffraction 4.2248 41.9485 -- 152 2887 0.1673 0.196 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.884
f_bond_d 0.008
f_dihedral_angle_d 10.706
f_plane_restr 0.006
f_chiral_restr 0.055
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2647
Nucleic Acid Atoms 0
Heterogen Atoms 35
Solvent Atoms 198

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2155: ???)
XDS data reduction
XSCALE data scaling
PHASER phasing