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X-RAY DIFFRACTION
Materials and Methods page
4QIK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.7
    Temperature 293.0
    Details 0.1 M sodium citrate/citric acid buffer, pH 5.7, 1.5 M lithium chloride, 18%-21% PEG6000, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 90.8 α = 90
    b = 93.1 β = 90
    c = 100.2 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2013-07-18
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock double crystal sagittal focusing Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.979
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 129493
    Number Reflections(Observed) 129493
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.069
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.97
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.439
    Mean I Over Sigma(Observed) 3.4
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.9
    Resolution(Low) 39.682
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 128927
    Number of Reflections(Observed) 128927
    Number of Reflections(R-Free) 6371
    Percent Reflections(Observed) 99.69
    R-Factor(Observed) 0.1791
    R-Work 0.1774
    R-Free 0.212
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9679
    Number of Reflections(R-Free) 650
    Number of Reflections(R-Work) 12267
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9679
    Shell Resolution(Low) 2.0467
    Number of Reflections(R-Free) 616
    Number of Reflections(R-Work) 12346
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2381
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0467
    Shell Resolution(Low) 2.1398
    Number of Reflections(R-Free) 617
    Number of Reflections(R-Work) 12288
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2298
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1398
    Shell Resolution(Low) 2.2526
    Number of Reflections(R-Free) 616
    Number of Reflections(R-Work) 12360
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2526
    Shell Resolution(Low) 2.3938
    Number of Reflections(R-Free) 664
    Number of Reflections(R-Work) 12228
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3938
    Shell Resolution(Low) 2.5786
    Number of Reflections(R-Free) 604
    Number of Reflections(R-Work) 12358
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.2128
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5786
    Shell Resolution(Low) 2.838
    Number of Reflections(R-Free) 692
    Number of Reflections(R-Work) 12218
    R-Factor(R-Work) 0.1878
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.838
    Shell Resolution(Low) 3.2485
    Number of Reflections(R-Free) 662
    Number of Reflections(R-Work) 12275
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2362
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2485
    Shell Resolution(Low) 4.0921
    Number of Reflections(R-Free) 606
    Number of Reflections(R-Work) 12265
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.1906
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0921
    Shell Resolution(Low) 39.6903
    Number of Reflections(R-Free) 644
    Number of Reflections(R-Work) 11951
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.077
    f_dihedral_angle_d 13.772
    f_angle_d 1.209
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4741
    Nucleic Acid Atoms 767
    Heterogen Atoms 20
    Solvent Atoms 885
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution SHELXD
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building SHELXD
    data collection CBASS