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X-RAY DIFFRACTION
Materials and Methods page
4Q4Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.7
    Temperature 300.0
    Details crystallization solution [100 mM Tris-HCl, 200 mM KCl, 50 mM MgCl2, 10 mM Spermine tetra HCl and 10% PEG 4000], pH 8.7, VAPOR DIFFUSION, HANGING DROP, temperature 300K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 184.49 α = 90
    b = 102.16 β = 98.96
    c = 294.72 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2013-06-05
     
    Diffraction Radiation
    Monochromator Rh coated Si
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.85
    Resolution(Low) 50
    Number Reflections(All) 260182
    Number Reflections(Observed) 111819
    Percent Possible(Observed) 88.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.9
    Resolution(Low) 29.781
    Cut-off Sigma(F) 1.39
    Number of Reflections(all) 260182
    Number of Reflections(Observed) 107568
    Number of Reflections(R-Free) 1686
    Percent Reflections(Observed) 89.48
    R-Factor(Observed) 0.2559
    R-Work 0.2556
    R-Free 0.2747
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9
    Shell Resolution(Low) 2.9853
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 7059
    R-Factor(R-Work) 0.386
    R-Factor(R-Free) 0.3791
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9853
    Shell Resolution(Low) 3.0815
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 7779
    R-Factor(R-Work) 0.3772
    R-Factor(R-Free) 0.4109
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0815
    Shell Resolution(Low) 3.1915
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 8275
    R-Factor(R-Work) 0.3657
    R-Factor(R-Free) 0.4222
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1915
    Shell Resolution(Low) 3.3192
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 8506
    R-Factor(R-Work) 0.3449
    R-Factor(R-Free) 0.3736
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3192
    Shell Resolution(Low) 3.47
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 8777
    R-Factor(R-Work) 0.319
    R-Factor(R-Free) 0.3794
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.47
    Shell Resolution(Low) 3.6527
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 8871
    R-Factor(R-Work) 0.2998
    R-Factor(R-Free) 0.3237
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6527
    Shell Resolution(Low) 3.881
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 9045
    R-Factor(R-Work) 0.2696
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.881
    Shell Resolution(Low) 4.18
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 9157
    R-Factor(R-Work) 0.2442
    R-Factor(R-Free) 0.2423
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.18
    Shell Resolution(Low) 4.5992
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 9437
    R-Factor(R-Work) 0.2217
    R-Factor(R-Free) 0.2555
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5992
    Shell Resolution(Low) 5.2616
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 9470
    R-Factor(R-Work) 0.2113
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2616
    Shell Resolution(Low) 6.617
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 9626
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.617
    Shell Resolution(Low) 29.7821
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 9880
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 14.536
    f_angle_d 0.93
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 27740
    Nucleic Acid Atoms 886
    Heterogen Atoms 65
    Solvent Atoms 56
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.9_1692)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building Phaser
    data collection CBASS