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X-RAY DIFFRACTION
Materials and Methods page
4PWD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.2
    Temperature 277.0
    Details 9-11% PEG8000, 100 mM ammonium sulfate, 5% glycerol, 5% sucrose, 20 mM magnesium chloride, pH 7.2-7.4, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 89.68 α = 90
    b = 130.76 β = 100.75
    c = 141.87 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2013-11-18
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.915
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(All) 64540
    Number Reflections(Observed) 61963
    Percent Possible(Observed) 96.2
    R Merge I(Observed) 0.097
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.05
    Percent Possible(All) 90.9
    R Merge I(Observed) 0.669
    Mean I Over Sigma(Observed) 1.6
    Redundancy 3.0
    Number Unique Reflections(All) 3219
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 44.678
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 61963
    Number of Reflections(R-Free) 1837
    Percent Reflections(Observed) 96.17
    R-Factor(All) 0.2234
    R-Factor(Observed) 0.2234
    R-Work 0.2213
    R-Free 0.2909
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.0811
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 4354
    R-Factor(R-Work) 0.3536
    R-Factor(R-Free) 0.4015
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0811
    Shell Resolution(Low) 3.1717
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4337
    R-Factor(R-Work) 0.3324
    R-Factor(R-Free) 0.4443
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1717
    Shell Resolution(Low) 3.2741
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4406
    R-Factor(R-Work) 0.3106
    R-Factor(R-Free) 0.307
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2741
    Shell Resolution(Low) 3.3911
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 4500
    R-Factor(R-Work) 0.2855
    R-Factor(R-Free) 0.3277
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3911
    Shell Resolution(Low) 3.5268
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 4522
    R-Factor(R-Work) 0.2615
    R-Factor(R-Free) 0.3425
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5268
    Shell Resolution(Low) 3.6872
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4625
    R-Factor(R-Work) 0.2445
    R-Factor(R-Free) 0.3058
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6872
    Shell Resolution(Low) 3.8815
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4695
    R-Factor(R-Work) 0.2198
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8815
    Shell Resolution(Low) 4.1245
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4752
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.285
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1245
    Shell Resolution(Low) 4.4427
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 4773
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4427
    Shell Resolution(Low) 4.8893
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4813
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8893
    Shell Resolution(Low) 5.5957
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4840
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5957
    Shell Resolution(Low) 7.0455
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 4809
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0455
    Shell Resolution(Low) 44.683
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 4700
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.011
    f_chiral_restr 0.076
    f_dihedral_angle_d 19.497
    f_angle_d 1.649
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 15812
    Nucleic Acid Atoms 1649
    Heterogen Atoms 47
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8.4_1496)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.4_1496)
    model building MOLREP
    data collection HKL-2000