X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 9
Temperature 293.0
Details 16% PEG3350, 12% isopropanol, 0.1 M phenol, 0.1 M Tris, pH 9.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.16 α = 90
b = 107.67 β = 107.1
c = 68.52 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2011-11-19
PIXEL DECTRIS PILATUS 6M -- 2011-12-09
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Si(111) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97920 APS 24-ID-E
SYNCHROTRON SSRL BEAMLINE BL11-1 0.97926, 0.91837 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 65.49 99.4 0.057 -- -- 3.8 -- 44375 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.28 98.7 0.741 -- -- 3.7 4372

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.3 41.588 -- 1.36 -- 38697 1960 99.36 -- 0.2141 0.212 0.2529 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.3575 -- 137 2615 0.2584 0.3449 -- 99.0
X Ray Diffraction 2.3575 2.4213 -- 139 2597 0.2566 0.3597 -- 99.0
X Ray Diffraction 2.4213 2.4925 -- 144 2598 0.2429 0.3125 -- 99.0
X Ray Diffraction 2.4925 2.5729 -- 137 2592 0.2351 0.3424 -- 99.0
X Ray Diffraction 2.5729 2.6649 -- 146 2624 0.238 0.2819 -- 99.0
X Ray Diffraction 2.6649 2.7716 -- 139 2621 0.2349 0.2976 -- 99.0
X Ray Diffraction 2.7716 2.8977 -- 142 2633 0.2332 0.268 -- 100.0
X Ray Diffraction 2.8977 3.0504 -- 132 2612 0.2401 0.3112 -- 100.0
X Ray Diffraction 3.0504 3.2415 -- 157 2611 0.2324 0.2991 -- 100.0
X Ray Diffraction 3.2415 3.4916 -- 125 2658 0.2295 0.2868 -- 100.0
X Ray Diffraction 3.4916 3.8428 -- 120 2633 0.2049 0.2276 -- 100.0
X Ray Diffraction 3.8428 4.3983 -- 151 2648 0.1907 0.2301 -- 100.0
X Ray Diffraction 4.3983 5.5393 -- 141 2648 0.1813 0.2032 -- 100.0
X Ray Diffraction 5.5393 41.5946 -- 150 2647 0.1987 0.2086 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.053
f_dihedral_angle_d 14.352
f_angle_d 0.776
f_bond_d 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6343
Nucleic Acid Atoms 191
Heterogen Atoms 11
Solvent Atoms 177

Software

Computing
Computing Package Purpose
ADSC Quantum Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX Structure Solution
PHENIX (phenix.refine: 1.8.2_1309) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.2_1309) refinement
PHENIX model building
ADSC version: Quantum data collection