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X-RAY DIFFRACTION
Materials and Methods page
4OL8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 291.0
    Details 0.1 M Tris, 0.2 M ammonium sulfate, 17% PEG3350, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 320.7 α = 90
    b = 75.06 β = 90
    c = 108.35 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2013-12-04
     
    Diffraction Radiation
    Monochromator double crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.979
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3
    Resolution(Low) 48.9
    Number Reflections(All) 53285
    Number Reflections(Observed) 53285
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.102
    Redundancy 5.1
     
    High Resolution Shell Details
    Resolution(High) 2.999
    Resolution(Low) 3.29
    Percent Possible(All) 98.4
    R Merge I(Observed) 0.847
    Mean I Over Sigma(Observed) 2.1
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 3.1
    Resolution(Low) 48.898
    Cut-off Sigma(F) 1.3
    Number of Reflections(Observed) 48418
    Number of Reflections(R-Free) 2425
    Percent Reflections(Observed) 99.08
    R-Factor(Observed) 0.2305
    R-Work 0.227
    R-Free 0.2956
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1
    Shell Resolution(Low) 3.1352
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2914
    R-Factor(R-Work) 0.3482
    R-Factor(R-Free) 0.3919
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1352
    Shell Resolution(Low) 3.1721
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2820
    R-Factor(R-Work) 0.3305
    R-Factor(R-Free) 0.3705
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1721
    Shell Resolution(Low) 3.2108
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2929
    R-Factor(R-Work) 0.3232
    R-Factor(R-Free) 0.3694
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2108
    Shell Resolution(Low) 3.2514
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2900
    R-Factor(R-Work) 0.3007
    R-Factor(R-Free) 0.3768
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2514
    Shell Resolution(Low) 3.2942
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.2928
    R-Factor(R-Free) 0.3589
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2942
    Shell Resolution(Low) 3.3393
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2826
    R-Factor(R-Work) 0.2858
    R-Factor(R-Free) 0.3646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3393
    Shell Resolution(Low) 3.387
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2948
    R-Factor(R-Work) 0.2815
    R-Factor(R-Free) 0.3444
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.387
    Shell Resolution(Low) 3.4375
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2855
    R-Factor(R-Work) 0.2838
    R-Factor(R-Free) 0.3283
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4375
    Shell Resolution(Low) 3.4912
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2872
    R-Factor(R-Work) 0.2636
    R-Factor(R-Free) 0.35
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4912
    Shell Resolution(Low) 3.5485
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2895
    R-Factor(R-Work) 0.2549
    R-Factor(R-Free) 0.3378
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5485
    Shell Resolution(Low) 3.6096
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.2528
    R-Factor(R-Free) 0.3413
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6096
    Shell Resolution(Low) 3.6753
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.2333
    R-Factor(R-Free) 0.2965
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6753
    Shell Resolution(Low) 3.7459
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2909
    R-Factor(R-Work) 0.2292
    R-Factor(R-Free) 0.2979
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7459
    Shell Resolution(Low) 3.8224
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2834
    R-Factor(R-Work) 0.22
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8224
    Shell Resolution(Low) 3.9054
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2892
    R-Factor(R-Work) 0.2172
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9054
    Shell Resolution(Low) 3.9962
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.3248
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9962
    Shell Resolution(Low) 4.0961
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2853
    R-Factor(R-Work) 0.2198
    R-Factor(R-Free) 0.2923
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0961
    Shell Resolution(Low) 4.2068
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2914
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2068
    Shell Resolution(Low) 4.3305
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.2069
    R-Factor(R-Free) 0.2998
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3305
    Shell Resolution(Low) 4.4702
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2860
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.2932
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4702
    Shell Resolution(Low) 4.6299
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2886
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2528
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6299
    Shell Resolution(Low) 4.8151
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2854
    R-Factor(R-Work) 0.1903
    R-Factor(R-Free) 0.3053
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8151
    Shell Resolution(Low) 5.034
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2904
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.034
    Shell Resolution(Low) 5.2991
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2871
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2991
    Shell Resolution(Low) 5.6307
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2850
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2957
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6307
    Shell Resolution(Low) 6.0647
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2879
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.3033
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0647
    Shell Resolution(Low) 6.6737
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.2911
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6737
    Shell Resolution(Low) 7.6362
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2860
    R-Factor(R-Work) 0.2063
    R-Factor(R-Free) 0.2543
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.6362
    Shell Resolution(Low) 9.6088
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2867
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.6088
    Shell Resolution(Low) 48.904
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2828
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_dihedral_angle_d 15.782
    f_angle_d 1.069
    f_bond_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12734
    Nucleic Acid Atoms 1360
    Heterogen Atoms 10
    Solvent Atoms 1
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution AutoSol
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building AutoSol
    data collection XDS