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X-RAY DIFFRACTION
Materials and Methods page
4NQA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 295.0
    Details 6% PEG8000, 18% isopropanol, 0.05 M Tris, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 85.78 α = 90
    b = 85.78 β = 90
    c = 238.58 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-08-08
     
    Diffraction Radiation
    Monochromator cryo-cooled double crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.97920
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.42
    Observed Criterion Sigma(I) 11.7
    Resolution(High) 3.1
    Resolution(Low) 100
    Number Reflections(All) 31133
    Number Reflections(Observed) 30417
    Percent Possible(Observed) 97.7
    R Merge I(Observed) 0.097
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.21
    Percent Possible(All) 95.5
    R Merge I(Observed) 0.537
    Mean I Over Sigma(Observed) 1.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.102
    Resolution(Low) 48.971
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 25687
    Number of Reflections(Observed) 25687
    Number of Reflections(R-Free) 1313
    Percent Reflections(Observed) 82.62
    R-Factor(Observed) 0.1864
    R-Work 0.1803
    R-Free 0.2178
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1052
    Shell Resolution(Low) 3.2292
    Number of Reflections(R-Free) 73
    Number of Reflections(R-Work) 1276
    R-Factor(R-Work) 0.335
    R-Factor(R-Free) 0.3511
    Percent Reflections(Observed) 37.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2292
    Shell Resolution(Low) 3.3756
    Number of Reflections(R-Free) 94
    Number of Reflections(R-Work) 1624
    R-Factor(R-Work) 0.2489
    R-Factor(R-Free) 0.3215
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3756
    Shell Resolution(Low) 3.5528
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2375
    R-Factor(R-Work) 0.2278
    R-Factor(R-Free) 0.2662
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5528
    Shell Resolution(Low) 3.7742
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3045
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7742
    Shell Resolution(Low) 4.0638
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3155
    R-Factor(R-Work) 0.1818
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0638
    Shell Resolution(Low) 4.4694
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3251
    R-Factor(R-Work) 0.1618
    R-Factor(R-Free) 0.19
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4694
    Shell Resolution(Low) 5.1084
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3180
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1084
    Shell Resolution(Low) 6.4071
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3203
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2225
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4071
    Shell Resolution(Low) 21.3601
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3168
    R-Factor(R-Work) 0.1607
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.056
    f_dihedral_angle_d 16.727
    f_angle_d 0.828
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11380
    Nucleic Acid Atoms 1464
    Heterogen Atoms 134
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building PHASES
    data collection HKL-2000