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X-RAY DIFFRACTION
Materials and Methods page
4N4A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7
    Temperature 291.0
    Details 35% Tacsimate , pH 7.0, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 139.36 α = 90
    b = 139.36 β = 90
    c = 146.26 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 2010-08-12
    Wavelength List 0.918410
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.93
    Observed Criterion Sigma(I) 2.93
    Resolution(High) 2.35
    Resolution(Low) 50
    Number Reflections(All) 30241
    Number Reflections(Observed) 30223
    Percent Possible(Observed) 99.94
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.35
    Resolution(Low) 37.745
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 30241
    Number of Reflections(Observed) 30223
    Number of Reflections(R-Free) 1511
    Percent Reflections(Observed) 99.94
    R-Factor(Observed) 0.156
    R-Work 0.1539
    R-Free 0.1957
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.35
    Shell Resolution(Low) 2.4259
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.2225
    R-Factor(R-Free) 0.2928
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4259
    Shell Resolution(Low) 2.5126
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5126
    Shell Resolution(Low) 2.6131
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2854
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6131
    Shell Resolution(Low) 2.732
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.732
    Shell Resolution(Low) 2.876
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.876
    Shell Resolution(Low) 3.0561
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0561
    Shell Resolution(Low) 3.292
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.1583
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.292
    Shell Resolution(Low) 3.623
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1395
    R-Factor(R-Free) 0.1733
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.623
    Shell Resolution(Low) 4.1467
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.1272
    R-Factor(R-Free) 0.154
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1467
    Shell Resolution(Low) 5.2222
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1197
    R-Factor(R-Free) 0.1547
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2222
    Shell Resolution(Low) 37.7503
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.1565
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 14.25
    f_angle_d 1.154
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3199
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 318
     
     
  •   Software and Computing Hide
    Computing
    Data Collection marccd
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building Phaser
    data collection marccd