X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 6.5
Temperature 291.0
Details 30% PEG 3350, 100 mM Bis-Tris [pH 6.5], and 100 mM NaBr, VAPOR DIFFUSION, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 52.21 α = 90.23
b = 60.04 β = 97.83
c = 87.04 γ = 116.25
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-225 -- 2012-03-13
Diffraction Radiation
Monochromator Protocol
Si-111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.918410 BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 30.33 93.9 -- -- -- -- 26308 24703 1.9 1.9 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.86 94.5 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.704 30.334 -- 2.0 25583 24703 1248 96.56 -- 0.185 0.182 0.2415 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.704 2.8123 -- 136 2487 0.2073 0.2618 -- 93.0
X Ray Diffraction 2.8123 2.9402 -- 138 2622 0.2268 0.3203 -- 97.0
X Ray Diffraction 2.9402 3.0951 -- 138 2643 0.2201 0.2994 -- 98.0
X Ray Diffraction 3.0951 3.2888 -- 142 2659 0.2058 0.2746 -- 98.0
X Ray Diffraction 3.2888 3.5423 -- 138 2608 0.1922 0.2371 -- 97.0
X Ray Diffraction 3.5423 3.8982 -- 137 2595 0.1657 0.212 -- 97.0
X Ray Diffraction 3.8982 4.4607 -- 141 2647 0.1607 0.2326 -- 97.0
X Ray Diffraction 4.4607 5.6142 -- 139 2609 0.1632 0.2148 -- 96.0
X Ray Diffraction 5.6142 30.3357 -- 139 2585 0.1666 0.2126 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.055
f_dihedral_angle_d 13.995
f_angle_d 0.791
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6411
Nucleic Acid Atoms 148
Heterogen Atoms 118
Solvent Atoms 130

Software

Computing
Computing Package Purpose
marccd Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.8.2_1309) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.2_1309) refinement
Phaser model building
marccd data collection