POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4N48
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 6.5
    Temperature 291.0
    Details 30% PEG 3350, 100 mM Bis-Tris [pH 6.5], and 100 mM NaBr, VAPOR DIFFUSION, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.21 α = 90.23
    b = 60.04 β = 97.83
    c = 87.04 γ = 116.25
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Collection Date 2012-03-13
     
    Diffraction Radiation
    Monochromator Si-111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.918410
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.9
    Observed Criterion Sigma(I) 1.9
    Resolution(High) 2.7
    Resolution(Low) 30.33
    Number Reflections(All) 26308
    Number Reflections(Observed) 24703
    Percent Possible(Observed) 93.9
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.86
    Percent Possible(All) 94.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.704
    Resolution(Low) 30.334
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 25583
    Number of Reflections(Observed) 24703
    Number of Reflections(R-Free) 1248
    Percent Reflections(Observed) 96.56
    R-Factor(Observed) 0.185
    R-Work 0.182
    R-Free 0.2415
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.704
    Shell Resolution(Low) 2.8123
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.2073
    R-Factor(R-Free) 0.2618
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8123
    Shell Resolution(Low) 2.9402
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2268
    R-Factor(R-Free) 0.3203
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9402
    Shell Resolution(Low) 3.0951
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2201
    R-Factor(R-Free) 0.2994
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0951
    Shell Resolution(Low) 3.2888
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2058
    R-Factor(R-Free) 0.2746
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2888
    Shell Resolution(Low) 3.5423
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.1922
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5423
    Shell Resolution(Low) 3.8982
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.212
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8982
    Shell Resolution(Low) 4.4607
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1607
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4607
    Shell Resolution(Low) 5.6142
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.2148
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6142
    Shell Resolution(Low) 30.3357
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.055
    f_dihedral_angle_d 13.995
    f_angle_d 0.791
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6411
    Nucleic Acid Atoms 148
    Heterogen Atoms 118
    Solvent Atoms 130
     
     
  •   Software and Computing Hide
    Computing
    Data Collection marccd
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building Phaser
    data collection marccd