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X-RAY DIFFRACTION
Materials and Methods page
4MKW
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 7
    Temperature 290.0
    Details hanging drop, pH 7, EVAPORATION, temperature 290K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 25.38 α = 90
    b = 40.27 β = 90
    c = 65.4 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.22
    Resolution(Low) 10
    Number Reflections(All) 17417
    Number Reflections(Observed) 17380
    Percent Possible(Observed) 99.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.219
    Resolution(Low) 9.586
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 17417
    Number of Reflections(Observed) 17380
    Number of Reflections(R-Free) 1736
    Percent Reflections(Observed) 84.24
    R-Factor(Observed) 0.2132
    R-Work 0.2101
    R-Free 0.24
    R-Free Selection Details 10% random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2191
    Shell Resolution(Low) 1.2549
    Number of Reflections(R-Free) 63
    Number of Reflections(R-Work) 571
    R-Factor(R-Work) 0.3406
    R-Factor(R-Free) 0.3594
    Percent Reflections(Observed) 38.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2549
    Shell Resolution(Low) 1.2953
    Number of Reflections(R-Free) 95
    Number of Reflections(R-Work) 844
    R-Factor(R-Work) 0.3223
    R-Factor(R-Free) 0.3261
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2953
    Shell Resolution(Low) 1.3415
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1173
    R-Factor(R-Work) 0.3065
    R-Factor(R-Free) 0.3112
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3415
    Shell Resolution(Low) 1.3951
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1451
    R-Factor(R-Work) 0.2756
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3951
    Shell Resolution(Low) 1.4584
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 1499
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.2715
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4584
    Shell Resolution(Low) 1.535
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 1530
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.535
    Shell Resolution(Low) 1.6307
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 1513
    R-Factor(R-Work) 0.2141
    R-Factor(R-Free) 0.2272
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6307
    Shell Resolution(Low) 1.7559
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 1523
    R-Factor(R-Work) 0.1864
    R-Factor(R-Free) 0.197
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7559
    Shell Resolution(Low) 1.9313
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 1557
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9313
    Shell Resolution(Low) 2.2078
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 1546
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2021
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2078
    Shell Resolution(Low) 2.7704
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 1555
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2394
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7704
    Shell Resolution(Low) 9.5866
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 882
    R-Factor(R-Work) 0.2307
    R-Factor(R-Free) 0.2859
    Percent Reflections(Observed) 53.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.022
    f_chiral_restr 0.282
    f_dihedral_angle_d 31.262
    f_angle_d 2.07
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 488
    Heterogen Atoms 1
    Solvent Atoms 193
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)