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X-RAY DIFFRACTION
Materials and Methods page
4M7D
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 291.0
    Details 100mM Sodium cacodylate 6.5, 25% Jeffamine ED2001, 5mM MgCl2, 8mM BaCl2, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 125.54 α = 90
    b = 78.48 β = 103.17
    c = 142.99 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2013-07-27
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9792
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.6
    Resolution(Low) 40
    Number Reflections(All) 41994
    Number Reflections(Observed) 41448
    Percent Possible(Observed) 98.7
     
    High Resolution Shell Details
    Resolution(High) 2.595
    Resolution(Low) 2.69
    Percent Possible(All) 95.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.595
    Resolution(Low) 34.184
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 42559
    Number of Reflections(Observed) 41437
    Number of Reflections(R-Free) 2098
    Percent Reflections(Observed) 98.35
    R-Factor(Observed) 0.242
    R-Work 0.2399
    R-Free 0.2828
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 13.304
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -4.7817
    Anisotropic B[2][2] -2.4816
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.6292
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5948
    Shell Resolution(Low) 2.6552
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2328
    R-Factor(R-Work) 0.3797
    R-Factor(R-Free) 0.3968
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6552
    Shell Resolution(Low) 2.7215
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.3752
    R-Factor(R-Free) 0.4668
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7215
    Shell Resolution(Low) 2.7951
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.3522
    R-Factor(R-Free) 0.347
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7951
    Shell Resolution(Low) 2.8773
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.3313
    R-Factor(R-Free) 0.422
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8773
    Shell Resolution(Low) 2.9701
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.3181
    R-Factor(R-Free) 0.3585
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9701
    Shell Resolution(Low) 3.0762
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.3034
    R-Factor(R-Free) 0.3982
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0762
    Shell Resolution(Low) 3.1993
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2978
    R-Factor(R-Free) 0.3124
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1993
    Shell Resolution(Low) 3.3448
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.2656
    R-Factor(R-Free) 0.3256
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3448
    Shell Resolution(Low) 3.5209
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2477
    R-Factor(R-Free) 0.2944
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5209
    Shell Resolution(Low) 3.7413
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.2973
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7413
    Shell Resolution(Low) 4.0297
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.2812
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0297
    Shell Resolution(Low) 4.4345
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2524
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4345
    Shell Resolution(Low) 5.0744
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0744
    Shell Resolution(Low) 6.3864
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.2742
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3864
    Shell Resolution(Low) 34.1874
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.088
    f_dihedral_angle_d 20.341
    f_angle_d 1.465
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8179
    Nucleic Acid Atoms 186
    Heterogen Atoms 0
    Solvent Atoms 90
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection CBASS