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X-RAY DIFFRACTION
Materials and Methods page
4M7A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 291.0
    Details 100mM sodium cacodylate 6.5, 25% Jeffamine ED2001, 5mM MgCl2, 8mM BaCl2, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.62 α = 90
    b = 78.38 β = 100.58
    c = 140.57 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2013-06-13
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9791
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.78
    Resolution(Low) 40
    Number Reflections(All) 31677
    Number Reflections(Observed) 31170
    Percent Possible(Observed) 98.4
     
    High Resolution Shell Details
    Resolution(High) 2.781
    Resolution(Low) 2.9
    Percent Possible(All) 99.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.781
    Resolution(Low) 39.189
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 31831
    Number of Reflections(Observed) 31163
    Number of Reflections(R-Free) 1576
    Percent Reflections(Observed) 97.9
    R-Factor(Observed) 0.2465
    R-Work 0.2447
    R-Free 0.2784
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 9.536
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -10.0121
    Anisotropic B[2][2] -3.4226
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 11.1968
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.781
    Shell Resolution(Low) 2.8707
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.3629
    R-Factor(R-Free) 0.4029
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8707
    Shell Resolution(Low) 2.9733
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.3327
    R-Factor(R-Free) 0.3946
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9733
    Shell Resolution(Low) 3.0923
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.318
    R-Factor(R-Free) 0.3691
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0923
    Shell Resolution(Low) 3.233
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2886
    R-Factor(R-Free) 0.3293
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.233
    Shell Resolution(Low) 3.4033
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.2591
    R-Factor(R-Free) 0.3146
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4033
    Shell Resolution(Low) 3.6164
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.282
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6164
    Shell Resolution(Low) 3.8954
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2538
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8954
    Shell Resolution(Low) 4.287
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2299
    R-Factor(R-Free) 0.2819
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.287
    Shell Resolution(Low) 4.9063
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9063
    Shell Resolution(Low) 6.1775
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.2433
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1775
    Shell Resolution(Low) 39.1934
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.2488
    R-Factor(R-Free) 0.2662
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.085
    f_dihedral_angle_d 20.517
    f_angle_d 1.269
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8089
    Nucleic Acid Atoms 206
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection CBASS