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X-RAY DIFFRACTION
Materials and Methods page
4M75
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 291.0
    Details 100mM MES 6.5, 25% PEG600, 20mM CaCl2, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 66.67 α = 93.14
    b = 67.83 β = 108.21
    c = 98.24 γ = 116.3
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-01-11
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9795
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.95
    Resolution(Low) 40
    Percent Possible(Observed) 98.5
     
    High Resolution Shell Details
    Resolution(High) 2.95
    Resolution(Low) 3.06
    Percent Possible(All) 98.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.95
    Resolution(Low) 38.66
    Cut-off Sigma(F) 0.89
    Number of Reflections(all) 60091
    Number of Reflections(Observed) 58102
    Number of Reflections(R-Free) 2954
    Percent Reflections(Observed) 96.7
    R-Factor(Observed) 0.267
    R-Work 0.266
    R-Free 0.291
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 7.3686
    Anisotropic B[1][2] 9.7927
    Anisotropic B[1][3] 2.5732
    Anisotropic B[2][2] 3.7437
    Anisotropic B[2][3] 3.2479
    Anisotropic B[3][3] 15.6374
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.95
    Shell Resolution(Low) 2.9984
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.4012
    R-Factor(R-Free) 0.454
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9984
    Shell Resolution(Low) 3.0501
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.3727
    R-Factor(R-Free) 0.3384
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0501
    Shell Resolution(Low) 3.1055
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.359
    R-Factor(R-Free) 0.4703
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1055
    Shell Resolution(Low) 3.1652
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.3673
    R-Factor(R-Free) 0.3508
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1652
    Shell Resolution(Low) 3.2298
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.3665
    R-Factor(R-Free) 0.4604
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2298
    Shell Resolution(Low) 3.3
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.3405
    R-Factor(R-Free) 0.3565
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3
    Shell Resolution(Low) 3.3767
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.32
    R-Factor(R-Free) 0.4151
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3767
    Shell Resolution(Low) 3.4611
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2938
    R-Factor(R-Free) 0.2863
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4611
    Shell Resolution(Low) 3.5546
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.2743
    R-Factor(R-Free) 0.3283
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5546
    Shell Resolution(Low) 3.6591
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2742
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6591
    Shell Resolution(Low) 3.7772
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.2774
    R-Factor(R-Free) 0.2744
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7772
    Shell Resolution(Low) 3.912
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.2649
    R-Factor(R-Free) 0.2704
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.912
    Shell Resolution(Low) 4.0685
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2554
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0685
    Shell Resolution(Low) 4.2534
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.2447
    R-Factor(R-Free) 0.2928
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2534
    Shell Resolution(Low) 4.4774
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.21
    R-Factor(R-Free) 0.2043
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4774
    Shell Resolution(Low) 4.7574
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.2378
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7574
    Shell Resolution(Low) 5.124
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.124
    Shell Resolution(Low) 5.6382
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2833
    R-Factor(R-Free) 0.2869
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6382
    Shell Resolution(Low) 6.4508
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.3068
    R-Factor(R-Free) 0.3717
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4508
    Shell Resolution(Low) 8.115
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2497
    R-Factor(R-Work) 0.2726
    R-Factor(R-Free) 0.2776
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.115
    Shell Resolution(Low) 38.6609
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2473
    R-Factor(R-Work) 0.2451
    R-Factor(R-Free) 0.2735
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.01
    f_chiral_restr 0.09
    f_dihedral_angle_d 22.49
    f_angle_d 1.665
    f_bond_d 0.019
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9317
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection CBASS