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X-RAY DIFFRACTION
Materials and Methods page
4LX6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9
    Temperature 277.0
    Details 3M 1,6-hexanediol, 0.1 M tris ph9.0, 0.2 M MgCl2, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.1 α = 90
    b = 151.69 β = 90
    c = 24.77 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-07-14
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength List 1.0
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.15
    Observed Criterion Sigma(I) 2.15
    Resolution(High) 2.15
    Resolution(Low) 47.5
    Number Reflections(All) 10992
    Number Reflections(Observed) 10915
    Percent Possible(Observed) 99.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.15
    Resolution(Low) 47.5
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 10894
    Number of Reflections(R-Free) 523
    Percent Reflections(Observed) 99.33
    R-Factor(Observed) 0.2064
    R-Work 0.2038
    R-Free 0.2548
     
    Temperature Factor Modeling
    Mean Isotropic B Value 57.4802
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.15
    Shell Resolution(Low) 2.3664
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.2845
    R-Factor(R-Free) 0.3853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3664
    Shell Resolution(Low) 2.7088
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.2943
    R-Factor(R-Free) 0.3698
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7088
    Shell Resolution(Low) 3.4126
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2255
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4126
    Shell Resolution(Low) 47.5841
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.038
    f_dihedral_angle_d 12.416
    f_angle_d 0.91
    f_bond_d 0.005
     
    Coordinate Error
    Luzzati ESD(Observed) 0.34
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 0
    Nucleic Acid Atoms 1502
    Heterogen Atoms 17
    Solvent Atoms 22
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix