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X-RAY DIFFRACTION
Materials and Methods page
4LMG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.6
    Temperature 298.0
    Details 23% PEG2000 MME, 0.2 M MAGNESIUM CHLORIDE, 0.1 M BIS-TRIS, PH 6.6, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.54 α = 90
    b = 127.45 β = 90.04
    c = 70.77 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-04-07
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength 1.28162
    Wavelength List 1.28162
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.2
    Resolution(Low) 19.93
    Number Reflections(Observed) 36252
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.078
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.32
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.559
    Mean I Over Sigma(Observed) 3.6
    Redundancy 7.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.2
    Resolution(Low) 19.93
    Cut-off Sigma(F) 0.19
    Number of Reflections(Observed) 36218
    Number of Reflections(R-Free) 1953
    Percent Reflections(Observed) 97.3
    R-Factor(Observed) 0.192
    R-Work 0.189
    R-Free 0.236
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.2617
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.4644
    Anisotropic B[2][2] -9.5208
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 16.7825
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.255
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2273
    R-Factor(R-Work) 0.2525
    R-Factor(R-Free) 0.2922
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.255
    Shell Resolution(Low) 2.3159
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2374
    R-Factor(R-Work) 0.2271
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3159
    Shell Resolution(Low) 2.3839
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2366
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2843
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3839
    Shell Resolution(Low) 2.4607
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2408
    R-Factor(R-Work) 0.2131
    R-Factor(R-Free) 0.2726
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4607
    Shell Resolution(Low) 2.5485
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2387
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2803
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5485
    Shell Resolution(Low) 2.6503
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2448
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.3512
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6503
    Shell Resolution(Low) 2.7706
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2447
    R-Factor(R-Work) 0.2401
    R-Factor(R-Free) 0.3101
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7706
    Shell Resolution(Low) 2.9163
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2497
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.2844
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9163
    Shell Resolution(Low) 3.0984
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2460
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0984
    Shell Resolution(Low) 3.3366
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.1924
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3366
    Shell Resolution(Low) 3.6704
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2500
    R-Factor(R-Work) 0.1674
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6704
    Shell Resolution(Low) 4.1972
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1972
    Shell Resolution(Low) 5.2718
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2518
    R-Factor(R-Work) 0.1423
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2718
    Shell Resolution(Low) 19.9317
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2053
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.043
    f_dihedral_angle_d 17.146
    f_angle_d 0.682
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4053
    Nucleic Acid Atoms 1036
    Heterogen Atoms 6
    Solvent Atoms 253
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6.4_486)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.6.4_486)
    model building PHENIX
    data collection XDS