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X-RAY DIFFRACTION
Materials and Methods page
4LD0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 291.0
    Details 0.3-0.5 M ammonium phosphate, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.36 α = 90
    b = 106.36 β = 90
    c = 132.65 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2009-09-24
     
    Diffraction Radiation
    Monochromator horizontally side diffracting Silicon 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-2
    Wavelength List 0.873
    Site ESRF
    Beamline ID23-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.2
    Observed Criterion Sigma(I) 2.2
    Resolution(High) 3.7
    Resolution(Low) 50
    Number Reflections(All) 9622
    Number Reflections(Observed) 9622
    Percent Possible(Observed) 99.5
     
    High Resolution Shell Details
    Resolution(High) 3.7
    Resolution(Low) 3.96
    Percent Possible(All) 97.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.75
    Resolution(Low) 46.053
    Cut-off Sigma(F) 2.02
    Number of Reflections(Observed) 9255
    Number of Reflections(R-Free) 464
    Percent Reflections(Observed) 99.8
    R-Factor(Observed) 0.2699
    R-Work 0.2668
    R-Free 0.3293
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7509
    Shell Resolution(Low) 4.2933
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2871
    R-Factor(R-Work) 0.2752
    R-Factor(R-Free) 0.3205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2933
    Shell Resolution(Low) 5.4078
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.302
    R-Factor(R-Free) 0.36
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4078
    Shell Resolution(Low) 46.0569
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3010
    R-Factor(R-Work) 0.2496
    R-Factor(R-Free) 0.3192
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.01
    f_chiral_restr 0.089
    f_dihedral_angle_d 25.306
    f_angle_d 1.952
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2243
    Nucleic Acid Atoms 1118
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building Phaser
    data collection MAR