X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 291.0
Details 0.3-0.5 M ammonium phosphate, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 106.36 α = 90
b = 106.36 β = 90
c = 132.65 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2009-09-24
Diffraction Radiation
Monochromator Protocol
horizontally side diffracting Silicon 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-2 0.873 ESRF ID23-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.7 50 99.5 -- -- -- -- 9622 9622 2.2 2.2 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.7 3.96 97.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.75 46.053 -- 2.02 -- 9255 464 99.8 -- 0.2699 0.2668 0.3293 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.7509 4.2933 -- 151 2871 0.2752 0.3205 -- 100.0
X Ray Diffraction 4.2933 5.4078 -- 154 2910 0.302 0.36 -- 100.0
X Ray Diffraction 5.4078 46.0569 -- 159 3010 0.2496 0.3192 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.01
f_dihedral_angle_d 25.306
f_chiral_restr 0.089
f_bond_d 0.017
f_angle_d 1.952
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2243
Nucleic Acid Atoms 1118
Heterogen Atoms 0
Solvent Atoms 0

Software

Software
Software Name Purpose
MAR data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.8.2_1309)
XDS data reduction
XDS data scaling