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X-RAY DIFFRACTION
Materials and Methods page
4LCK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 50 mM Bis-Tris (HCl) pH 6.5, 300 mM Li2SO4, and 20% (w/v) PEG3350, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.38 α = 90
    b = 108.47 β = 90
    c = 266.89 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Detector CCD
    Type ADSC QUANTUM 315r
    Detector CCD
    Type ADSC QUANTUM 315
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-08-02
     
    Diffraction Radiation
    Monochromator Kohzu HLD8-24 monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.2
    Wavelength List 0.9793
    Site ALS
    Beamline 5.0.2
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.1
    Wavelength List 0.9793
    Site ALS
    Beamline 5.0.1
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.9793
    Site APS
    Beamline 24-ID-C
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.9793
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.5
    Observed Criterion Sigma(I) 1.5
    Resolution(High) 3.2
    Resolution(Low) 28.42
    Percent Possible(Observed) 98.9
    R Merge I(Observed) 0.062
    B(Isotropic) From Wilson Plot 128.66
    Redundancy 6.1
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.2653
    Percent Possible(All) 98.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT, SAD
    reflnsShellList 3.2
    Resolution(Low) 28.416
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 46354
    Number of Reflections(Observed) 45770
    Number of Reflections(R-Free) 2318
    Percent Reflections(Observed) 98.74
    R-Factor(Observed) 0.1984
    R-Work 0.1957
    R-Free 0.2514
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 128.001
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.2653
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2486
    R-Factor(R-Work) 0.3472
    R-Factor(R-Free) 0.38
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2653
    Shell Resolution(Low) 3.3362
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.3214
    R-Factor(R-Free) 0.3475
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3362
    Shell Resolution(Low) 3.4136
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2537
    R-Factor(R-Work) 0.3176
    R-Factor(R-Free) 0.377
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4136
    Shell Resolution(Low) 3.4989
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.3075
    R-Factor(R-Free) 0.3229
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4989
    Shell Resolution(Low) 3.5933
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.2867
    R-Factor(R-Free) 0.3292
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5933
    Shell Resolution(Low) 3.6988
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.2676
    R-Factor(R-Free) 0.3333
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6988
    Shell Resolution(Low) 3.8179
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2537
    R-Factor(R-Work) 0.2458
    R-Factor(R-Free) 0.2903
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8179
    Shell Resolution(Low) 3.954
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.954
    Shell Resolution(Low) 4.1119
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.2135
    R-Factor(R-Free) 0.3009
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1119
    Shell Resolution(Low) 4.2984
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2535
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.2286
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2984
    Shell Resolution(Low) 4.5242
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5242
    Shell Resolution(Low) 4.8064
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2523
    R-Factor(R-Work) 0.1899
    R-Factor(R-Free) 0.2246
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8064
    Shell Resolution(Low) 5.1754
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1754
    Shell Resolution(Low) 5.6925
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6925
    Shell Resolution(Low) 6.5076
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.256
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5076
    Shell Resolution(Low) 8.1665
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.2442
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.1665
    Shell Resolution(Low) 28.4168
    Number of Reflections(R-Free) 89
    Number of Reflections(R-Work) 2414
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.181
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.422
    f_plane_restr 0.001
    f_chiral_restr 0.02
    f_angle_d 0.366
    f_bond_d 0.001
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1048
    Nucleic Acid Atoms 7586
    Heterogen Atoms 86
    Solvent Atoms 22
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) xds
    Data Reduction (data scaling) xds
    Structure Solution SHEX-D, PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix