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X-RAY DIFFRACTION
Materials and Methods page
4LB6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.4
    Temperature 293.0
    Details 2.0 M ammonium sulfate, 0.1 M sodium acetate, 7.5 % glycerol, pH 5.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 110.91 α = 90
    b = 110.91 β = 90
    c = 43.14 γ = 90
     
    Space Group
    Space Group Name:    I 4 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 70
     
    Diffraction Detector
    Detector PIXEL
    Type PILATUS 6M-F
    Collection Date 2012-09-29
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.97
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.8
    Resolution(Low) 32.55
    Number Reflections(Observed) 12161
    Percent Possible(Observed) 96.4
    R Merge I(Observed) 0.074
    B(Isotropic) From Wilson Plot 27.1
    Redundancy 4.6
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 96.0
    R Merge I(Observed) 0.679
    Mean I Over Sigma(Observed) 2.2
    Redundancy 4.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 28.072
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 12155
    Number of Reflections(R-Free) 1216
    Percent Reflections(Observed) 94.99
    R-Factor(Observed) 0.1841
    R-Work 0.1809
    R-Free 0.2116
    R-Free Selection Details lattice symmetry 10%
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8721
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.2328
    R-Factor(R-Free) 0.2574
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8721
    Shell Resolution(Low) 1.9573
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.251
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9573
    Shell Resolution(Low) 2.0604
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1178
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0604
    Shell Resolution(Low) 2.1895
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1213
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1895
    Shell Resolution(Low) 2.3584
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1211
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3584
    Shell Resolution(Low) 2.5956
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1231
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5956
    Shell Resolution(Low) 2.9709
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1241
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2175
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9709
    Shell Resolution(Low) 3.7416
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1244
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7416
    Shell Resolution(Low) 28.0754
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.1667
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.138
    f_dihedral_angle_d 19.133
    f_angle_d 2.062
    f_bond_d 0.019
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 535
    Nucleic Acid Atoms 123
    Heterogen Atoms 0
    Solvent Atoms 73
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building PHASER
    data collection DNA