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X-RAY DIFFRACTION
Materials and Methods page
4LB5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.2
    Temperature 293.0
    Details 1.7 M ammonium sulfate, 0.1 M sodium acetate, pH 5.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.86 α = 90
    b = 56.86 β = 90
    c = 218.77 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 70
     
    Diffraction Detector
    Detector PIXEL
    Type PILATUS 6M-F
    Collection Date 2012-09-29
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.97
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 29.3
    Number Reflections(Observed) 15007
    R Merge I(Observed) 0.088
    B(Isotropic) From Wilson Plot 34.88
    Redundancy 7.3
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.11
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.53
    Mean I Over Sigma(Observed) 3.7
    Redundancy 7.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method PDB ENTRY 1QBJ
    reflnsShellList 2.0
    Resolution(Low) 29.3
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 15006
    Number of Reflections(R-Free) 1501
    Percent Reflections(Observed) 99.46
    R-Factor(Observed) 0.1915
    R-Work 0.1879
    R-Free 0.2243
    R-Free Selection Details lattice symmetry 10%
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.0646
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1197
    R-Factor(R-Work) 0.2308
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0646
    Shell Resolution(Low) 2.1383
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.2126
    R-Factor(R-Free) 0.2806
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1383
    Shell Resolution(Low) 2.2239
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1192
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2239
    Shell Resolution(Low) 2.3251
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1205
    R-Factor(R-Work) 0.1993
    R-Factor(R-Free) 0.2404
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3251
    Shell Resolution(Low) 2.4476
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1209
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4476
    Shell Resolution(Low) 2.6009
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1224
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6009
    Shell Resolution(Low) 2.8016
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1212
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2443
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8016
    Shell Resolution(Low) 3.0832
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1229
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0832
    Shell Resolution(Low) 3.5287
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1251
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5287
    Shell Resolution(Low) 4.4433
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1265
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1903
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4433
    Shell Resolution(Low) 29.3061
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1333
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2194
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 18.351
    f_angle_d 1.074
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 999
    Nucleic Acid Atoms 247
    Heterogen Atoms 12
    Solvent Atoms 110
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection DNA