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X-RAY DIFFRACTION
Materials and Methods page
4KZX
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion
    pH 8.5
    Temperature 292.0
    Details 0.1M Ammonium acetate, 0.05M Tris-HCl pH 8.5, 2.5% PEG-20K, 4-6% MPD, 5.0mM Mg acetate, 2.0mM TCEP, vapor diffusion, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 292.12 α = 90
    b = 292.12 β = 90
    c = 477.67 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-07-24
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 9
    Resolution(Low) 80
    Number Reflections(All) 18057
    Number Reflections(Observed) 17938
    Percent Possible(Observed) 99.3
    B(Isotropic) From Wilson Plot 667.15
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 7.809
    Resolution(Low) 58.112
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 27341
    Number of Reflections(Observed) 25914
    Number of Reflections(R-Free) 1304
    Percent Reflections(Observed) 94.78
    R-Factor(Observed) 0.3469
    R-Work 0.3469
    R-Free 0.3471
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 216.999
    Anisotropic B[1][1] 669.983
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 669.983
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 411.798
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.809
    Shell Resolution(Low) 8.1209
    Number of Reflections(R-Free) 87
    Number of Reflections(R-Work) 1676
    R-Factor(R-Work) 0.4443
    R-Factor(R-Free) 0.4356
    Percent Reflections(Observed) 58.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.1209
    Shell Resolution(Low) 8.4894
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.4199
    R-Factor(R-Free) 0.4597
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.4894
    Shell Resolution(Low) 8.9355
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2822
    R-Factor(R-Work) 0.4027
    R-Factor(R-Free) 0.4322
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.9355
    Shell Resolution(Low) 9.4931
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2867
    R-Factor(R-Work) 0.3912
    R-Factor(R-Free) 0.4186
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.4931
    Shell Resolution(Low) 10.2224
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2851
    R-Factor(R-Work) 0.3863
    R-Factor(R-Free) 0.4208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 10.2224
    Shell Resolution(Low) 11.2444
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 2857
    R-Factor(R-Work) 0.3512
    R-Factor(R-Free) 0.3509
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 11.2444
    Shell Resolution(Low) 12.8562
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2862
    R-Factor(R-Work) 0.3582
    R-Factor(R-Free) 0.3308
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 12.8562
    Shell Resolution(Low) 16.1397
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.3608
    R-Factor(R-Free) 0.3838
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 16.1397
    Shell Resolution(Low) 58.1134
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2985
    R-Factor(R-Work) 0.3096
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 20.69
    f_plane_restr 0.022
    f_chiral_restr 0.24
    f_angle_d 2.813
    f_bond_d 0.026
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 39697
    Nucleic Acid Atoms 37514
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) xds
    Data Reduction (data scaling) xds
    Structure Solution phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix