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X-RAY DIFFRACTION
Materials and Methods page
4KQ7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.2
    Temperature 277.0
    Details 40.0% polyethylene glycol 300, 40.0% polyethylene glycol 300, 0.1M phosphate-citrate pH 4.2, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 133.93 α = 90
    b = 133.93 β = 90
    c = 133.93 γ = 90
     
    Space Group
    Space Group Name:    P 21 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (horizontal focusing)
    Collection Date 2013-01-24
     
    Diffraction Radiation
    Monochromator single crystal Si(111) bent
    Diffraction Protocol SAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength 0.97858
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.62
    Resolution(Low) 47.35
    Number Reflections(Observed) 101280
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.098
    B(Isotropic) From Wilson Plot 17.374
     
    High Resolution Shell Details
    Resolution(High) 1.62
    Resolution(Low) 1.68
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.821
    Mean I Over Sigma(Observed) 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.62
    Resolution(Low) 47.35
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 101241
    Number of Reflections(R-Free) 5061
    Percent Reflections(Observed) 99.94
    R-Factor(Observed) 0.1385
    R-Work 0.1376
    R-Free 0.1567
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.1663
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.62
    Shell Resolution(Low) 1.66
    Number of Reflections(R-Free) 350
    Number of Reflections(R-Work) 7089
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 99.94
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    t_other_torsion 2.76
    t_omega_torsion 4.99
    t_angle_deg 1.03
    t_bond_d 0.01
     
    Coordinate Error
    Luzzati ESD(Observed) 0.133
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6020
    Nucleic Acid Atoms 0
    Heterogen Atoms 96
    Solvent Atoms 878
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHELXD,SHARP
    Structure Refinement BUSTER 2.10.0
     
    Software
    refinement BUSTER-TNT version: 2.10.0
    data processing Xscale version: July 4, 2012
    phasing SHARP
    phasing SHELX
    data extraction pdb_extract version: 3.10
    validation MOLPROBITY version: 3beta29