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X-RAY DIFFRACTION
Materials and Methods page
4KNY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 285.0
    Details 10-15% PEG 4K, 0.1 M sodium acetate buffer (pH 5.5), 0.1 M MgCl2, VAPOR DIFFUSION, HANGING DROP, temperature 285K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 133.14 α = 90
    b = 133.14 β = 90
    c = 133.67 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-10-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0332
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.95
    Resolution(Low) 66.57
    Number Reflections(All) 26044
    Number Reflections(Observed) 25980
    Percent Possible(Observed) 99.75
    Redundancy 8.4
     
    High Resolution Shell Details
    Resolution(High) 2.95
    Resolution(Low) 3.05
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 3.8
    Redundancy 8.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.945
    Resolution(Low) 66.57
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 26044
    Number of Reflections(Observed) 25980
    Number of Reflections(R-Free) 2011
    Percent Reflections(Observed) 99.8
    R-Factor(Observed) 0.2116
    R-Work 0.2086
    R-Free 0.2483
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9451
    Shell Resolution(Low) 3.0188
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1672
    R-Factor(R-Work) 0.3003
    R-Factor(R-Free) 0.3863
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0188
    Shell Resolution(Low) 3.1004
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1695
    R-Factor(R-Work) 0.2743
    R-Factor(R-Free) 0.2977
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1004
    Shell Resolution(Low) 3.1916
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1669
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.2886
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1916
    Shell Resolution(Low) 3.2947
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1679
    R-Factor(R-Work) 0.2558
    R-Factor(R-Free) 0.3374
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2947
    Shell Resolution(Low) 3.4124
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1692
    R-Factor(R-Work) 0.2683
    R-Factor(R-Free) 0.327
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4124
    Shell Resolution(Low) 3.549
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1698
    R-Factor(R-Work) 0.2352
    R-Factor(R-Free) 0.2565
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.549
    Shell Resolution(Low) 3.7105
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1698
    R-Factor(R-Work) 0.217
    R-Factor(R-Free) 0.2581
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7105
    Shell Resolution(Low) 3.9061
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1696
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9061
    Shell Resolution(Low) 4.1508
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1707
    R-Factor(R-Work) 0.1977
    R-Factor(R-Free) 0.2207
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1508
    Shell Resolution(Low) 4.4713
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1715
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.213
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4713
    Shell Resolution(Low) 4.9211
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1722
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9211
    Shell Resolution(Low) 5.6329
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1741
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6329
    Shell Resolution(Low) 7.0955
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1763
    R-Factor(R-Work) 0.2274
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0955
    Shell Resolution(Low) 66.587
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1822
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2004
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.046
    f_dihedral_angle_d 19.537
    f_angle_d 0.763
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3556
    Nucleic Acid Atoms 981
    Heterogen Atoms 0
    Solvent Atoms 25
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MOSFLM
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1352)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1352)
    model building PHASER
    data collection MOSFLM