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X-RAY DIFFRACTION
Materials and Methods page
4KMU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 300.0
    Details 0.1 M HEPES-HCl, pH 7.0, 0.2 M calcium acetate, ~15% PEG400, 10 mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 300K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 184.52 α = 90
    b = 203.87 β = 90
    c = 307.87 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2012-11-12
     
    Diffraction Radiation
    Monochromator Horizontal focusing asymmetric cut Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.976
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.75
    Resolution(Low) 30
    Number Reflections(Observed) 103271
    Percent Possible(Observed) 90.6
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 3.75
    Resolution(Low) 3.81
    Percent Possible(All) 59.3
    Mean I Over Sigma(Observed) 1.4
    Redundancy 2.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.85
    Resolution(Low) 29.966
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 101755
    Number of Reflections(R-Free) 5085
    Percent Reflections(Observed) 92.44
    R-Factor(Observed) 0.2667
    R-Work 0.2638
    R-Free 0.3208
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.85
    Shell Resolution(Low) 3.8937
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2425
    R-Factor(R-Work) 0.426
    R-Factor(R-Free) 0.4227
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8937
    Shell Resolution(Low) 3.9394
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2446
    R-Factor(R-Work) 0.4104
    R-Factor(R-Free) 0.3944
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9394
    Shell Resolution(Low) 3.9873
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.3775
    R-Factor(R-Free) 0.43
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9873
    Shell Resolution(Low) 4.0377
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.3611
    R-Factor(R-Free) 0.3953
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0377
    Shell Resolution(Low) 4.0907
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.3506
    R-Factor(R-Free) 0.3995
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0907
    Shell Resolution(Low) 4.1466
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.3436
    R-Factor(R-Free) 0.3975
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1466
    Shell Resolution(Low) 4.2056
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2959
    R-Factor(R-Work) 0.3487
    R-Factor(R-Free) 0.3816
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2056
    Shell Resolution(Low) 4.2682
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.3354
    R-Factor(R-Free) 0.355
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2682
    Shell Resolution(Low) 4.3347
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3109
    R-Factor(R-Work) 0.3409
    R-Factor(R-Free) 0.397
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3347
    Shell Resolution(Low) 4.4056
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3185
    R-Factor(R-Work) 0.3382
    R-Factor(R-Free) 0.4011
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4056
    Shell Resolution(Low) 4.4813
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3208
    R-Factor(R-Work) 0.3117
    R-Factor(R-Free) 0.3619
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4813
    Shell Resolution(Low) 4.5625
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3269
    R-Factor(R-Work) 0.3037
    R-Factor(R-Free) 0.3528
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5625
    Shell Resolution(Low) 4.65
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3317
    R-Factor(R-Work) 0.3036
    R-Factor(R-Free) 0.3529
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.65
    Shell Resolution(Low) 4.7445
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3353
    R-Factor(R-Work) 0.2941
    R-Factor(R-Free) 0.3106
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7445
    Shell Resolution(Low) 4.8473
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3356
    R-Factor(R-Work) 0.291
    R-Factor(R-Free) 0.3668
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8473
    Shell Resolution(Low) 4.9595
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3370
    R-Factor(R-Work) 0.2848
    R-Factor(R-Free) 0.3698
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9595
    Shell Resolution(Low) 5.083
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3356
    R-Factor(R-Work) 0.2764
    R-Factor(R-Free) 0.3435
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.083
    Shell Resolution(Low) 5.2197
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3447
    R-Factor(R-Work) 0.2779
    R-Factor(R-Free) 0.3774
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2197
    Shell Resolution(Low) 5.3725
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3417
    R-Factor(R-Work) 0.2772
    R-Factor(R-Free) 0.3372
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3725
    Shell Resolution(Low) 5.5448
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3400
    R-Factor(R-Work) 0.2754
    R-Factor(R-Free) 0.3548
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5448
    Shell Resolution(Low) 5.7417
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3436
    R-Factor(R-Work) 0.2561
    R-Factor(R-Free) 0.3639
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7417
    Shell Resolution(Low) 5.9699
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3463
    R-Factor(R-Work) 0.259
    R-Factor(R-Free) 0.3726
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9699
    Shell Resolution(Low) 6.2392
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3446
    R-Factor(R-Work) 0.2589
    R-Factor(R-Free) 0.3347
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2392
    Shell Resolution(Low) 6.5649
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3462
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.322
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5649
    Shell Resolution(Low) 6.9714
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3471
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.3127
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.9714
    Shell Resolution(Low) 7.5018
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3489
    R-Factor(R-Work) 0.2258
    R-Factor(R-Free) 0.3086
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.5018
    Shell Resolution(Low) 8.2425
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3503
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2425
    Shell Resolution(Low) 9.4028
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3524
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.4028
    Shell Resolution(Low) 11.7272
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3539
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.2352
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 11.7272
    Shell Resolution(Low) 29.9672
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3683
    R-Factor(R-Work) 0.2452
    R-Factor(R-Free) 0.2667
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.026
    f_dihedral_angle_d 12.72
    f_angle_d 0.649
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 56075
    Nucleic Acid Atoms 0
    Heterogen Atoms 124
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8.2_1309)
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.2_1309)
    model building PHENIX version: (phenix.refine: 1.8.2_1309)
    data collection HKL-2000