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X-RAY DIFFRACTION
Materials and Methods page
4KI6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 298.0
    Details 50 MM TRIS-HCL, 16% PEG350, 180 MM CALCIUM CHLORIDE, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.85 α = 90
    b = 118.4 β = 90
    c = 127.97 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type MAR scanner 300 mm plate
    Collection Date 2012-12-10
     
    Diffraction Radiation
    Monochromator Mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.4
    Resolution(High) 2.55
    Resolution(Low) 50
    Number Reflections(All) 39756
    Number Reflections(Observed) 39756
    Percent Possible(Observed) 97.4
     
    High Resolution Shell Details
    Resolution(High) 2.55
    Resolution(Low) 2.59
    Percent Possible(All) 86.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.55
    Resolution(Low) 35.947
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 39756
    Number of Reflections(Observed) 39755
    Number of Reflections(R-Free) 1994
    Percent Reflections(Observed) 97.41
    R-Factor(Observed) 0.1972
    R-Work 0.1953
    R-Free 0.2326
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5489
    Shell Resolution(Low) 2.6126
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2383
    R-Factor(R-Work) 0.2799
    R-Factor(R-Free) 0.3268
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6126
    Shell Resolution(Low) 2.6832
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.2666
    R-Factor(R-Free) 0.2777
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6832
    Shell Resolution(Low) 2.7622
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.2549
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7622
    Shell Resolution(Low) 2.8513
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.2913
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8513
    Shell Resolution(Low) 2.9532
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.2453
    R-Factor(R-Free) 0.2852
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9532
    Shell Resolution(Low) 3.0713
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.3263
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0713
    Shell Resolution(Low) 3.211
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.2367
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.211
    Shell Resolution(Low) 3.3802
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.2248
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3802
    Shell Resolution(Low) 3.5918
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2523
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5918
    Shell Resolution(Low) 3.8688
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1883
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8688
    Shell Resolution(Low) 4.2576
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2576
    Shell Resolution(Low) 4.8724
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.1905
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8724
    Shell Resolution(Low) 6.1338
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.1735
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1338
    Shell Resolution(Low) 35.9506
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2859
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.2221
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.046
    f_dihedral_angle_d 11.075
    f_angle_d 0.652
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7098
    Nucleic Acid Atoms 652
    Heterogen Atoms 42
    Solvent Atoms 169
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8.1_1168)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX version: (phenix.refine: 1.8.1_1168)
    data collection HKL-2000